Genome-Wide Association Mapping for Resistance to Leaf and Stripe Rust in Winter-Habit Hexaploid Wheat Landraces

Leaf rust, caused by Puccinia triticina (Pt), and stripe rust, caused by P. striiformis f. sp. tritici (Pst), are destructive foliar diseases of wheat worldwide. Breeding for disease resistance is the preferred strategy of managing both diseases. The continued emergence of new races of Pt and Pst requires a constant search for new sources of resistance. Here we report a genome-wide association analysis of 567 winter wheat (Triticum aestivum) landrace accessions using the Infinium iSelect 9K wheat SNP array to identify loci associated with seedling resistance to five races of Pt (MDCL, MFPS, THBL, TDBG, and TBDJ) and one race of Pst (PSTv-37) frequently found in the Northern Great Plains of the United States. Mixed linear models identified 65 and eight significant markers associated with leaf rust and stripe rust, respectively. Further, we identified 31 and three QTL associated with resistance to Pt and Pst, respectively. Eleven QTL, identified on chromosomes 3A, 4A, 5A, and 6D, are previously unknown for leaf rust resistance in T. aestivum.     

小麦持久抗条锈品种斯汤佩利的遗传机制研究

对持久抗条锈小麦品种斯汤佩利进行了抗条锈特点研究和抗性遗传分析.斯汤佩利反应型0～1型,普遍率、严重度和病情指数3个抗性组分及其平均日变化率都很低,与三类对照品种之间有极显著差异.与中抗-中感为特征的、抗性由多基因或由主效基因与多基因共同控制的一般持久抗病品种相比,属于典型特例.其抗条锈性由2对显性基因互补控制,干尖性状由1对显性基因控制,二者之间不连锁,因此,干尖不能作为斯汤佩利抗锈性的辅助选择标记.     

Genetics of durable resistance to leaf rust and stripe rust of an Indian wheat cultivar HD2009

The Indian bread wheat cultivar HD2009 has maintained its partial resistance to leaf rust and stripe rust in India since its release in 1976. To examine the nature, number and mode of inheritance of its genes for partial leaf rust and stripe rust resistance, this cultivar was crossed with cultivar WL711, which is susceptible to leaf rust and stripe rust. The F1, F2, F3 and F5 generations from this cross were assessed separately for adult plant disease severity under artificial epidemic of race 77-5 of leaf rust and race 46S119 of stripe rust. Segregation for rust reaction in the F2, F3 and F5 generations indicated that resistance to each of these rust diseases is based on 2 genes, each with additive effects. Although the leaf rust resistance of HD2009 is similar in expression to that conferred by the gene Lr34, but unlike the wheats carrying this gene, cultivar HD2009 did not show leaf tip necrosis, a morphological marker believed to be tightly linked to the leaf rust resistance gene Lr34. Thus, the non-hypersensitive resistance of HD2009 was ascribed to genes other than Lr34.     

Determination of Rust Resistance Gene Complex Lr34/Yr18 in Spring Wheat and its Effect on Components of Partial Resistance

The non‐durable nature of hypersensitive (race‐specific) resistance has stimulated scientists to search for other options such as race‐non‐specific resistance to provide long‐lasting protection against plant diseases. Adult plant resistance gene complex Lr34/Yr18 confers a dual race‐non‐specific type of resistance to wheat against stripe rust (Puccinia striiformis f. sp. tritici) and leaf rust (P. triticina Eriks). This study was conducted to evaluate 59 spring bread wheat (Triticum aestivum L.) genotypes for the presence of the Lr34/Yr18‐linked csLV34 allele using STS marker csLV34 and to determine the effect of this gene complex on the components of partial resistance in wheat to leaf/stripe rust. Lr34/Yr18‐linked csLV34 allele was detected only in 12 genotypes, namely Iqbal 2000, NR‐281, NR 354, NR 363, NR 364, NR 366, NR 367, NR 370, NR 376, 4^thEBWYT 509, 4^thEBWYT 510 and 4^thEBWYT 518. Eleven genotypes showing the amplified Lr34/Yr18‐linked allele were further studied for the assessment of the effect of Lr34/Yr18 on components of partial resistance along with nine genotypes lacking this gene complex. Both stripe and leaf rusts were studied separately. The components of partial resistance including latency period (LP) and infection frequency (IF) were studied on primary leaf (seedling stage), fourth leaf and fully expanded young flag leaf (adult plant stage). Both the stripe and leaf rust fungi showed a prolonged LP and reduced IF on genotypes carrying Lr34/Yr18 gene complex. Generally, a longer LP was associated with a reduced IF at all growth stages. Although significant effect of Lr34/Yr18 gene complex on LP and IF was observed almost at all three growth stages, the effect was more pronounced at flag leaf. This suggested that Lr34/Yr18 gene complex is more effective at later stages of plant growth.     

Phenotypic and Molecular Assessment of Wheat Genotypes Tolerant to Leaf Blight,Rust and Blast Diseases

Globally among biotic stresses, diseases like blight, rust and blast constitute prime constraints for reducing wheat productivity especially in Bangladesh. For sustainable productivity, the development of disease-resistant lines and high yielding varieties is vital and necessary. This study was conducted using 122 advanced breeding lines of wheat including 21 varieties developed by Bangladesh Wheat and Maize Research Institute (BAMRI) with aims to identify genotypes having high yield potential and resistance to leaf blight, leaf rust and blast diseases. These genotypes were evaluated for resistance against leaf blight and leaf rust at Dinajpur and wheat blast at Jashore under field condition. Out of 122 genotypes tested, 20 lines were selected as resistant to leaf blight based on the area under the diseases progress curve (AUDPC) under both irrigated timely sown (ITS) and irrigated late sown (ILS) conditions. Forty-two genotypes were found completely free from leaf rust infection, 59 genotypes were identified as resistant, and 13 genotypes were identified as moderately resistant to leaf rust. Eighteen genotypes were immune against wheat blast, 42 genotypes were categorized as resistant, and 26 genotypes were identified as moderately resistant to wheat blast. Molecular data revealed that the 16 genotypes showed a positive 2NS segment among the 18 immune genotypes selected against wheat blast under field conditions. The genotypes BAW 1322, BAW 1295, and BAW 1203 can be used as earlier maturing genotypes and the genotypes BAW 1372, BAW 1373, BAW 1297 and BAW 1364 can be used for lodging tolerant due to short plant height. The genotypes WMRI Gom 1, BAW 1349 and BAW 1350 can be selected for bold grain and the genotypes WMRI Gom 1, BAW 1297, BAW 1377 can be used as high yielder for optimum seeding condition but genotypes BAW 1377 and BAW 1366 can be used for late sown condition. The selected resistant genotypes against specific diseases can be used in the further breeding program to develop wheat varieties having higher disease resistance and yield potential.     

Genome Wide Association Study of Seedling and Adult Plant Leaf Rust Resistance in Elite Spring Wheat Breeding Lines

Leaf rust is an important disease, threatening wheat production annually. Identification of resistance genes or QTLs for effective field resistance could greatly enhance our ability to breed durably resistant varieties. We applied a genome wide association study (GWAS) approach to identify resistance genes or QTLs in 338 spring wheat breeding lines from public and private sectors that were predominately developed in the Americas. A total of 46 QTLs were identified for field and seedling traits and approximately 20–30 confer field resistance in varying degrees. The 10 QTLs accounting for the most variation in field resistance explained 26–30% of the total variation (depending on traits: percent severity, coefficient of infection or response type). Similarly, the 10 QTLs accounting for most of the variation in seedling resistance to different races explained 24–34% of the variation, after correcting for population structure. Two potentially novel QTLs (QLr.umn-1AL, QLr.umn-4AS) were identified. Identification of novel genes or QTLs and validation of previously identified genes or QTLs for seedling and especially adult plant resistance will enhance understanding of leaf rust resistance and assist breeding for resistant wheat varieties. We also developed computer programs to automate field and seedling rust phenotype data conversions. This is the first GWAS study of leaf rust resistance in elite wheat breeding lines genotyped with high density 90K SNP arrays.     

Characterization of genetic loci conferring adult plant resistance to leaf rust and stripe rust in spring wheat.

Leaf (brown) and stripe (yellow) rusts, caused by Puccinia triticina and Puccinia striiformis, respectively, are fungal diseases of wheat (Triticum aestivum) that cause significant yield losses annually in many wheat-growing regions of the world. The objectives of our study were to characterize genetic loci associated with resistance to leaf and stripe rusts using molecular markers in a population derived from a cross between the rust-susceptible cultivar 'Avocet S' and the resistant cultivar 'Pavon76'. Using bulked segregant analysis and partial linkage mapping with AFLPs, SSRs and RFLPs, we identified 6 independent loci that contributed to slow rusting or adult plant resistance (APR) to the 2 rust diseases. Using marker information available from existing linkage maps, we have identified additional markers associated with resistance to these 2 diseases and established several linkage groups in the 'Avocet S' x 'Pavon76' population. The putative loci identified on chromosomes 1BL, 4BL, and 6AL influenced resistance to both stripe and leaf rust. The loci on chromosomes 3BS and 6BL had significant effects only on stripe rust, whereas another locus, characterized by AFLP markers, had minor effects on leaf rust only. Data derived from Interval mapping indicated that the loci identified explained 53% of the total phenotypic variation (R2) for stripe rust and 57% for leaf rust averaged across 3 sets of field data. A single chromosome recombinant line population segregating for chromosome 1B was used to map Lr46/Yr29 as a single Mendelian locus. Characterization of slow-rusting genes for leaf and stripe rust in improved wheat germplasm would enable wheat breeders to combine these additional loci with known slow-rusting loci to generate wheat cultivars with higher levels of slow-rusting resistance.     

TaLHY,a 1R-MYB Transcription Factor,Plays an Important Role in Disease Resistance against Stripe Rust Fungus and Ear Heading in Wheat

LHY (late elongated hypocotyl) is an important gene that regulates and controls biological rhythms in plants. Additionally, LHY is highly expressed in the SSH (suppression subtractive hybridization) cDNA library-induced stripe rust pathogen (CYR32) in our previous research. To identify the function of the LHY gene in disease resistance against stripe rust, we used RACE-PCR technology to clone TaLHY in the wheat variety Chuannong19. The cDNA of TaLHY is 3085 bp long with an open reading frame of 1947 bp. TaLHY is speculated to encode a 70.3 kDa protein of 648 amino acids , which has one typical plant MYB-DNA binding domain; additionally, phylogenetic tree shows that TaLHY has the highest homology with LHY of Brachypodium distachyon(BdLHY-like). Quantitative fluorescence PCR indicates that TaLHY has higher expression in the leaf, ear and stem of wheat but lower expression in the root. Infestation of CYR32 can result in up-regulated expression of TaLHY, peaking at 72 h. Using VIGS (virus-induced gene silencing) technology to disease-resistant wheat in the fourth leaf stage, plants with silenced TaLHY cannot complete their heading stage. Through the compatible interaction with the stripe rust physiological race CYR32, Chuannong 19 loses its immune capability toward the stripe rust pathogen, indicating that TaLHY may regulate and participate in the heading of wheat, as well as the defense responses against stripe rust infection.     

Stripe Rust Partial Resistance Increases Spring Bread Wheat Yield in South‐eastern Anatolia,Turkey

Stripe rust caused by Puccinia striiformis f.sp. tritici is the most serious disease of wheat globally including south‐eastern Anatolia of Turkey, where wheat originated. In this study, 12 spring wheat genotypes were artificially inoculated and preserved in two locations, Diyarbak?r and Ad?yaman, during the 2011–2012 season to investigate loss in yield and yield components. Genotypes were evaluated at the adult plant stage using two partial resistance parameters: final disease severity and area under the disease progress curve (AUDPC). AUDPC ranged from 14.8 to 860 in Diyarbak?r, and 74 to 760 in Ad?yaman. Yield loss ranged from 0.6 to 68.5% in Diyarbak?r and 9.8 to 56.8% in Ad?yaman. Genotypes G1, G5, G7 and G8 were found to lose less yield, while higher yield loss was observed in G3, G4 (Nurkent), G5 and G9 (Karacada?‐98). The highest loss in thousand kernel weight was observed in a susceptible cultivar Karacada?‐98 in Diyarbak?r followed by 43.4 and 24.4% in Ad?yaman. Test weight loss reached 8.89% in Diyarbak?r and 20.8% in Ad?yaman. Yield loss and AUDPC had a positive significant relationship. Based on the values of AUDPC, final disease severity and yield loss, three major clusters were formed for 12 wheat genotypes. Partially resistant genotypes were found to lose less grain yield and seemed to be stronger against severe stripe rust pressure.     

抗条锈病小麦品种9365在抗病育种中的利用与评价

9365是陕西省小麦研究中心创制的抗条锈病小麦品种.经多年观察、利用发现,9365对条锈病表现高抗,其穗大、成穗率高、落黄好、高产、综合农艺性状好,是陕西省小麦抗条锈病育种可资利用的抗条锈小麦品种.其缺点是植株偏高、成熟偏晚、抗性受隐性基因控制.     

小麦叶锈病新抗源筛选

小麦叶锈病是小麦生产的主要病害之一,发病严重时往往导致大幅度减产。叶锈菌生理小种的变异易导致抗病基因抗性的丧失,因此不断获得新抗源对小麦抗病育种至关重要。小麦近缘植物中含有丰富的小麦育种所需的抗病基因。本研究从小麦-近缘植物双二倍体、附加系、代换系或易位系等创新种质中筛选出小麦叶锈病新抗源,为利用这些新抗源打下基础。苗期对116份供试材料人工接种美国堪萨斯州流行的小麦叶锈菌混合生理小种 (Lrcomp) ,其中部分材料人工接种09-9-1441-1等5个中国当前流行的叶锈菌生理小种进行抗性鉴定,筛选获得新抗源。116份种质中,31份免疫、近免疫或高抗Lrcomp。含有希尔斯山羊草、尾状山羊草、拟斯卑尔脱山羊草、两芒山羊草、卵穗山羊草、沙融山羊草、柱穗山羊草、顶芒山羊草、小伞山羊草、偏凸山羊草、中间偃麦草、茸毛偃麦草、长穗偃麦草、粗穗披碱草、栽培黑麦、非洲黑麦、提莫菲维染色质的部分种质免疫或高抗Lrcomp,而含二角山羊草、无芒山羊草、沙生冰草、多年生簇毛麦和一年生簇毛麦染色质的种质表现中感至高感Lrcomp。希尔斯山羊草4S染色体、尾状山羊草C#1和D#1染色体和两芒山羊草、顶芒山羊草中可能含有未被报道的抗Lrcomp的新基因,值得进一步向小麦转育。小麦-粗穗披碱草1HtS.1BL罗伯逊易位系对Lrcomp及 09-9-1441-1和09-9-1426-1等5个中国当前流行叶锈菌生理小种近免疫,值得利用染色体工程等方法获得小片段抗病易位系应用于我国小麦抗叶锈育种。     

Undescribed wheat gene for partial leaf rust and stripe rust resistance from Thatcher derivatives RL6058 and 90RN249 carryingLr34

Inheritance of partial leaf rust and stripe rust resistance of a Thatcher wheat 90RN2491, earlier reported to carry two doses of the gene pairLr34-Yr18 and the reference line RL6058 (6*Thatcher/PI58548) for theLr34-Yr18 gene pair was studied against predominant and highly virulent Indian races. Thatcher derivatives 90RN2491 and RL6058 were intercrossed as well as crossed with the leaf rust and stripe rust susceptible Indian cultivar WL711. The F₁, F₂ and F₃ generations from these crosses were assessed for rust severity against leaf rust race 77-5 and stripe rust race 46S119. The F₂ and F₃ generations from the crosses of RL6058 and 90RN2491 with WL711, segregated 15 resistant : 1 susceptible (F₂) and 7 homozygous resistant : 8 segregating : 1 homozygous susceptible (F₃) ratios, respectively, both for leaf rust and stripe rust severity. Therefore, partial resistance against each of the leaf rust and stripe rust races in both RL6058 and 90RN2491 is ascribed to two independently inherited dominant genes. One of the two genes for leaf rust and stripe rust resistance in 90RN2491 and RL6058 isLr34 and the linked geneYr18, respectively. The second leaf rust resistance gene in both the Thatcher lines segregated independently of stripe rust resistance. Therefore, it is notLr34 and it remains unidentified.     

The Lr34 adult plant rust resistance gene provides seedling resistance in durum wheat without senescence

The hexaploid wheat (Triticum aestivum) adult plant resistance gene, Lr34/Yr18/Sr57/Pm38/Ltn1, provides broad‐spectrum resistance to wheat leaf rust (Lr34), stripe rust (Yr18), stem rust (Sr57) and powdery mildew (Pm38) pathogens, and has remained effective in wheat crops for many decades. The partial resistance provided by this gene is only apparent in adult plants and not effective in field‐grown seedlings. Lr34 also causes leaf tip necrosis (Ltn1) in mature adult plant leaves when grown under field conditions. This D genome‐encoded bread wheat gene was transferred to tetraploid durum wheat (T. turgidum) cultivar Stewart by transformation. Transgenic durum lines were produced with elevated gene expression levels when compared with the endogenous hexaploid gene. Unlike nontransgenic hexaploid and durum control lines, these transgenic plants showed robust seedling resistance to pathogens causing wheat leaf rust, stripe rust and powdery mildew disease. The effectiveness of seedling resistance against each pathogen correlated with the level of transgene expression. No evidence of accelerated leaf necrosis or up‐regulation of senescence gene markers was apparent in these seedlings, suggesting senescence is not required for Lr34 resistance, although leaf tip necrosis occurred in mature plant flag leaves. Several abiotic stress‐response genes were up‐regulated in these seedlings in the absence of rust infection as previously observed in adult plant flag leaves of hexaploid wheat. Increasing day length significantly increased Lr34 seedling resistance. These data demonstrate that expression of a highly durable, broad‐spectrum adult plant resistance gene can be modified to provide seedling resistance in durum wheat.     

Evaluation of Macroscopic and Microscopic Components of Partial Resistance to Leaf Rust in Durum Wheat

Leaf rust, caused by the fungus Puccinia triticina, is considered one of the most important foliar diseases in durum wheat. Hypersensitive resistance (HR) may be rapidly overcome by the pathogen when resistant cultivars are grown on a large acreage or following changes in virulence in the pathogen population. Prolonging the durability of the resistance requires uses of other types of resistance such as partial resistance (PR). In this study, six durum wheat lines provided by the International Center for Corn and Wheat Improvement (CIMMYT) with a high level of PR to leaf rust were studied in monocyclic tests in a growth chamber. Inoculations were performed on both primary and fifth leaves using the Spanish race DGB/BN. UV fluorescence microscopy was employed to determine microscopic components of the resistance, such as the number of early aborted infection units not associated with plant cell necrosis (EA?) and relative colony size (RCS) of the established infection units. Macroscopic components of PR such as latency period, infection frequency and uredinium size were measured as well. All six resistant lines were characterized by a higher EA? and smaller RCS respect to the susceptible control ‘Don Rafael’. Line 3 showed the highest level of PR. It had 22% of EA? compared with 4% in the susceptible control, and the smallest RCS (17% respect to RCS of ‘Don Rafael’) at adult plant stage. Both EA? and RCS had a high heritability (more than 97%) and the correlation with macroscopic parameters (latency period and uredinium size) was also high (significant at 0.001 level). Hence, PR to leaf rust in these durum wheat genotypes has been revealed at microscopic level (higher EA? and smaller RCS).     

Haustorium Formation and Cell Wall Appositions in Susceptible and Partially Resistant Wheat and Barley Seedlings Infected with Wheat Leaf Rust

Phase contrast light microscopy observations of wheat and barley seedlings infected with wheat leaf rust spores suggested that cell wall appositions are structural barriers against haustorium formation leading to abortion of infection structures. Nearly equal numbers of cell wall appositions per infection structure were detected in seedlings of susceptible and partially resistant wheat genotypes. Differences between susceptible and partially resistant genotypes became evident after the first haustorium had been formed. This again indicates the presence of a post-haustorial effect of partial resistance. Some factors influencing nutrient uptake are discussed. Wheat leaf rust colonies hardly formed haustoria in barley seedlings, the few not aborted infection structures were accompanied by cell collapse. The mechanisms of partial resistance in wheat and barley to their respective leaf rust fungi seem different, but their non-host reactions appear similar.     

Stripe rust and leaf rust resistance QTL mapping,epistatic interactions,and co-localization with stem rust resistance loci in spring wheat evaluated over three continents

Key message

In wheat, advantageous gene-rich or pleiotropic regions for stripe, leaf, and stem rust and epistatic interactions between rust resistance loci should be accounted for in plant breeding strategies.

Abstract

Leaf rust (Puccinia triticina Eriks.) and stripe rust (Puccinia striiformis f. tritici Eriks) contribute to major production losses in many regions worldwide. The objectives of this research were to identify and study epistatic interactions of quantitative trait loci (QTL) for stripe and leaf rust resistance in a doubled haploid (DH) population derived from the cross of Canadian wheat cultivars, AC Cadillac and Carberry. The relationship of leaf and stripe rust resistance QTL that co-located with stem rust resistance QTL previously mapped in this population was also investigated. The Carberry/AC Cadillac population was genotyped with DArT^® and simple sequence repeat markers. The parents and population were phenotyped for stripe rust severity and infection response in field rust nurseries in Kenya (Njoro), Canada (Swift Current), and New Zealand (Lincoln); and for leaf rust severity and infection response in field nurseries in Canada (Swift Current) and New Zealand (Lincoln). AC Cadillac was a source of stripe rust resistance QTL on chromosomes 2A, 2B, 3A, 3B, 5B, and 7B; and Carberry was a source of resistance on chromosomes 2B, 4B, and 7A. AC Cadillac contributed QTL for resistance to leaf rust on chromosome 2A and Carberry contributed QTL on chromosomes 2B and 4B. Stripe rust resistance QTL co-localized with previously reported stem rust resistance QTL on 2B, 3B, and 7B, while leaf rust resistance QTL co-localized with 4B stem rust resistance QTL. Several epistatic interactions were identified both for stripe and leaf rust resistance QTL. We have identified useful combinations of genetic loci with main and epistatic effects. Multiple disease resistance regions identified on chromosomes 2A, 2B, 3B, 4B, 5B, and 7B are prime candidates for further investigation and validation of their broad resistance.     

15个小麦农家品种抗叶锈基因分析

本研究旨在明确小麦农家品种中可能含有的抗叶锈病基因,为抗源的选择和利用提供理论依据。以15个小麦农家品种、感病对照品种郑州5389和36个含有已知抗叶锈病基因的载体品种为材料,苗期接种19个具有鉴别力的叶锈菌生理小种进行基因推导,同时利用12个与抗叶锈病基因紧密连锁的分子标记进行分析。为明确其成株期抗性,分别于2016-2017年和2017-2018年在河北保定对小麦农家品种、感病对照品种郑州5389与慢锈品种SAAR进行田间接种,调查并记录田间严重度及普遍率。基因推导和分子标记检测结果显示,在15个小麦农家品种中共检测到7个抗叶锈病基因,其中部分品种还有多个抗性基因,如红狗豆含有Lr1和Lr46;黄花麦含有Lr13和Lr34;大白麦含有Lr14b和Lr26;洋麦含有Lr37和Lr46;成都光头含有Lr34和Lr46;墨脱麦和西山扁穗含有Lr26和Lr46。部分品种含有1个成株期慢叶锈病抗性基因,如同家坝小麦、武都白茧儿、边巴春麦-6、白花麦含有Lr34;红抢麦、白扁穗和白火麦含有Lr46。这些携带有效抗叶锈病基因的农家品种,可为小麦抗叶锈病育种提供抗源。     

Application of thermal and visible imaging to estimate stripe rust disease severity in wheat using supervised image classification methods

Reliable and accurate estimation of plant disease severity at the field scale is a key factor for predicting yield losses, disease management and food security. A field experiment was designed and conducted during 2017–18 and 2018–19 with 24 wheat cultivars to estimate the stripe rust severity by supervised classification of thermal and visible images using parallelepiped, minimum distance, mahalanobis distance, maximum likelihood, support vector machine and neural network methods of image classification. Results demonstrated the potential of thermal and visible imaging techniques to estimate wheat stripe rust severity with good accuracy. For both visible and thermal images used in this study, support vector machine gave the best estimates of the rust severity, while the parallelepiped method was the worst-performing method. Support vector machine and neural network methods showed d-index, Nash-Sutcliffe efficiency and coefficient of determination values above 85%, with accuracies above 98% and kappa coefficient above 0.97 for both thermal and visible images. Comparison of thermal and visible image classification performance revealed that for all the methods except support vector machine, the estimated rust severity, overall accuracy and kappa coefficient of thermal images were better than visible images. The present study clearly showed that both thermal and visible image analysis can be applied as a rapid non-destructive technique to estimate the wheat rust severity under field conditions. The study also provided a comparative insight into thermal and visible image classification methods that have great potential for sustainable plant disease management in modern agriculture.     

普通小麦Qz180中一个抗条锈病基因的分子作图(英文)

普通小麦(Triticum aestivum L.)材料Qz180具有良好的抗条锈病特性,经基因推导发现其含有一个优良的抗条锈病的基因,暂定名为YrQz。用Qz180与感病材料铭贤169和WL1分别杂交构建了两个F_2群体,用条中30号条锈菌小种对这两个群体进行的抗性测验表明,YrQz为显性单基因遗传。通过SSR和AFLP结合BSA的方法对这个基因进行了分子作图,结果鉴定出与YrQz连锁的2个SSR标记和2个AFLP标记。根据SSR标记的染色体位置,该基因被定位在2B染色体的长臂上,位于两个SSR位点Xgwm388和Xgwm526之间;两个AFLP标记P35M48(452)和P36M61(163)分别位于该基因的两侧,遗传距离分别为3.4cM和4.1cM。     

条锈菌诱导的抗锈小麦种质的基因表达分析

以条锈菌接种前后的抗条锈病种质N 95175的小麦幼苗叶片为材料,利用抑制消减杂交技术,构建了条锈菌接种初期小麦抗性种质叶片的SSH-cDNA文库。通过对文库中随机选取的50个阳性克隆提取质粒,进行测序,共获得已知功能的EST序列14条,如蛋白激酶、锌指蛋白、细胞色素P 450和OM T 1等抗病相关基因,它们涉及植物的信号传导、转录调控、丙烷代谢途径及防卫反应等方面。