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Analysis of one-way layout of count data with negative binomial variation

Authors:	BARNWAL R K; PAUL S R

Institution:	Department of Mathematics, and Statistics, University of Windsor Windsor, Ontario, Canada N9B3P4

Abstract:

Keywords:	Common dispersion parameter C( ${alpha}$ ) statistic" target="_blank">gif" ALT="{alpha}" BORDER="0">) statistic Equality of means Equality of dispersion parameters Negative binomial distribution
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