Reanalysis of Vernalization Data of Wheat and Carrot

Vernalization is an important determinant of the growth, development,and yield of biennial and perennial crops. Accurate simulationof its response to temperature is thus an important componentof successful crop systems modelling. Vernalization has a lowoptimum temperature compared to other temperature responsesof plants, and thus may be difficult to treat using expressionsthat are appropriate for other plant processes. This paper examinesthe application of a simple equation that has been used forother processes. It reads as v=V_max(T_max-T_{Tmax- Topt} ) (T_Topt)^{T_optTmax-T_opt}, where v is thedaily rate of vernalization progress at temperature T, T_optandT_maxare the optimum and maximum temperatures for vernalization,respectively, andV_max is the maximum daily rate of vernalization(the inverse of the minimum number of days required to completevernalization), which occurs at T_opt. The model was appliedto published vernalization data for wheat and carrot. The fitsto data were good (adjusted R²for wheat of 0.94, for carrot0.98), with estimatedT_opt and T_maxbeing 5.7±0.5 and 21.3±1.4°C, respectively, for wheat ‘Norin 27’ and 6.6±0.2and 14.1±0.3 °C for carrot ‘ Chantenay RedCored’. The estimated parameters, in particular the highT_maxfor wheat, were close to those reported using differentanalytical approaches. It was suggested that the function wouldbe useful for summarizing vernalization data, and that its usewould avoid the abrupt changes that are inevitable when differentlinear relationships are used for part of the overall response.It was also suggested the high T_maxshould be taken into accountwhen interpreting data obtained with wheat grown under warmconditions. Copyright 1999 Annals of Botany Company Plant, vernalization, temperature response, modelling, wheat (Triticum aestivum L.), carrot (Daucus carota L.).