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Characteristics of the Infection of Tilletia laevis Kühn (syn. Tilletia foetida (Wallr.) Liro.) in Compatible Wheat
Authors:Zhaoyu Ren  Wei Zhang  Mengke Wang  Haifeng Gao  Huimin Shen  Chunping Wang  Taiguo Liu  Wanquan Chen  Li Gao
Institution:1.State Key Laboratory for Biology of Plant Disease and Insect Pests, Institute of Plant Protection, Chinese Academy of Agricultural Sciences, Beijing 100193, China; 2.College of Agronomy, Henan University of Science and Technology, Henan 471023, China; 3.Institute of Plant Protection, Xinjiang Academy of Agricultural Sciences, Key Laboratory of Integrated Pest Management on Crop in Northwestern Oasis, Ministry of Agriculture and Rural Affairs, Urumqi 830091, China
Abstract:Tilletia laevis Kühn (syn. Tilletia foetida (Wallr.) Liro.) causes wheat common bunt, which is one of the most devastating plant diseases in the world. Common bunt can result in a reduction of 80% or even a total loss of wheat production. In this study, the characteristics of T. laevis infection in compatible wheat plants were defined based on the combination of scanning electron microscopy, transmission electron microscopy and laser scanning confocal microscopy. We found T. laevis could lead to the abnormal growth of wheat tissues and cells, such as leakage of chloroplasts, deformities, disordered arrangements of mesophyll cells and also thickening of the cell wall of mesophyll cells in leaf tissue. What’s more, T. laevis teliospores were found in the roots, stems, flag leaves, and glumes of infected wheat plants instead of just in the ovaries, as previously reported. The abnormal characteristics caused by T. laevis may be used for early detection of this pathogen instead of molecular markers in addition to providing theoretical insights into T. laevis and wheat interactions for breeding of common bunt resistance.
Keywords:laser scanning confocal microscopy  scanning electron microscopy  Tilletia laevis Kü  hn  transmission electron microscopy  wheat common bunt
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