Molecular mapping of QTLs for wheat flag leaf senescence under water-stress

A segregating population from the cross between drought sensitive (Variant-2) and drought tolerant (Cham-6) genotypes was made to identify molecular markers linked to wheat (Triticum aestivum L.) flag leaf senescence under water-stress. From 38 random amplified polymorphic DNA (RAPD) primers, 25 inter-simple sequence repeat (ISSR) primers and 46 simple sequence repeat (SRR) primers, tested for polymorphism among parental genotypes and F2 population. Quantitative trait locus (QTL) for flag leaf senescence was associated with 1 RAPD marker (Pr9), 4 ISSR markers (Pr8, AD5, AD2 and AD3), and 1 SSR marker (Xgwm382) and explained 44, 50, 35, 31, 22 and 73 % phenotypic variation, respectively. The genetic distance between flag leaf senescence gene and Pr9 was 10.0 cM (LOD score 22.9). The markers Pr8, AD5, AD2 and AD3 had genetic distances of 10.5, 14.6, 15.6 and 18.1 cM, respectively (LOD scores 22.6, 17.8, 17.5 and 14.6). The genetic distance between Xgwm382 was 3.9 cM (LOD score 33.8). Therefore, the RAPD, ISSR and SSR markers linked to the QTL for the drought-induced flag leaf senescence can be further used in breeding for drought tolerance in wheat.