首页 | 本学科首页   官方微博 | 高级检索  
   检索      


Comparability between Durham method and real-time monitoring for long-term observation of Japanese cedar (<Emphasis Type="Italic">Cryptomeria japonica</Emphasis>) and Japanese cypress (<Emphasis Type="Italic">Cryptomeria obtusa</Emphasis>) pollen counts in Niigata prefecture,Japan
Authors:Kanako Watanabe  Tsuyoshi Ohizumi
Institution:1.Division of Laboratory Science,Niigata University Graduate School of Health Sciences,Niigata,Japan;2.Niigata Prefectural Institute of Public Health and Environmental Sciences,Niigata,Japan
Abstract:Japanese cedar (Cryptomeria japonica) pollinosis (JCP), affecting more than a quarter of the Japanese population, is a significant public health problem, due to its negative impact on daily activity. JCP patients have used the four-stage daily pollen deposition information based on the pollen monitoring over 20 years. However, the procedure for monitoring pollen was recently changed dramatically, to hourly average pollen concentration monitoring. In that type of monitoring, JCP patients cannot identify pollen exposure level because the relationship between hourly average pollen concentration and daily pollen deposition is unclear. Based on the parallel monitoring of concentration and deposition counts that we performed in Niigata prefecture, Eastern Japan, we found that the relationship between the daily pollen deposition (pollen cm?2 day?1) and the daily-average pollen concentration (pollen m?3) calculated from hourly average pollen concentration was not only statistically significant but also consistent with the aerodynamic properties of pollen. Using the relationship, we proposed new range criteria of hourly average pollen concentrations corresponding to the four stages of pollen deposition. Additionally, the conversion of pollen deposition to pollen concentration made the long-term trend analysis of the daily-average pollen concentration possible in this study area, and an increasing trend was identified at one site.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号