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Survival with competing risks and masked causes of failures |
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| Authors: | FLEHTNGER, BETTY J. REISER, BENJAMIN YASHCHIN, EMMANUEL |
| Affiliation: | Mathematical Sciences Department, IBM Research Division, T. J. Watson Research Center, Yorktown Heights New York 10598, U.S.A. aisen{at}watson.ibm.com rsst305{at}uvm.haifa.ac.il yashchi{at}watsonibm.com |
| Abstract: | |
| Keywords: | Kaplan-Meier Life testing Masking Propotional hazards Reliability |
| 本文献已被 Oxford 等数据库收录！ | |