原子力显微镜定量测定采后蘑菇的表面粗糙度

蘑菇表面的失水情况是评价采后蘑菇质量的重要指标.我们提出用原子力显微镜定量测定蘑菇表皮的粗糙度来表示表面的皱缩程度,用算术平均粗糙度和平方根粗糙度表示.双孢蘑菇(Agaricus bisporus(Lange)Sing)贮藏前的算术平均粗糙度为(34.033±5.116)nm,经过2d贮藏,在2℃、25℃和动态温度自发气调贮藏下,其算术平均粗糙度分别为(40.139±3.359)nm、(65.356±8.253)nm和(43.670±9.280)nm.平方根粗糙度值与算术平均粗糙度值有相似的变化趋势,两者均随贮藏时间的延长和温度的增加而增大.表皮的三维图像直观地表示出水分的蒸发过程,变化趋势符合粗糙度值的变化,特别是在贮藏的早期阶段(0～2 d).由粗糙度分析的结果可以区别不同的贮藏条件表明,原子力显微镜测定的粗糙度指标可有效地表示采后蘑菇的表面失水情况.

Quantitative Roughness Analysis of Post-harvest Agaricus bisporus by Atomic Force Microscopy

The moisture loss degree is important in determining the quality of post-harvest mushroom (Agaricus bisporus (Lange) Sing). Quantitative roughness analyzed by atomic force microscopy (AFM) was proposed to denote the degree of shrinkage, with arithmetic average roughness (R_a) and root mean square roughness (R_q) as parameters. The initial value of R_a was (30.035±1.839) nm, while those of 2 ℃, 25 ℃ and dynamic temperature on the 2nd day were (40.139±3.359) nm, (54.393±13.534) nm and (41.197± 6.555) nm, respectively. There is a similar tendency for the results of R_a and R_q. Both values of roughness increased in duration of storage and with increasing temperatures. The three-dimensional profile of the pileus epicutis could signify the process of water evaporation intuitionally. The tendency was in accordance with the roughness results, especially for the earlier stage of the storage (0-2 d). The outcome of roughness analysis could signify the differences of storage conditions. It was shown that the roughness measured by atomic force microscopy effectively reflected the moisture loss degree of the mushroom pileus epicutis during post-harvest storage.