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Limits of detection of a total reflection x-ray fluorescence system with double reflection module |
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| Authors: | Nascimento Filho V F Poblete V H Parreira P S Matsumoto E Simabuco S M Espinoza E P Navarro A A |
| Institution: | 1.Laborat?io de Instrumenta??o Muclear/CEMA/USP, au,Centenário 303, CP 96 CEP, 13400-970, Piracicaba S?o Paulo, Brazil ;2.Departamento de Física e Meteorologia/ESALQ/USP, au, Pádua Dias, 11, CP 9, CEP, 13418-900, Piracicaba, S?o Paulo, Brazil ;3.Laboratorio de Fluorescencia de Rayos X/CCHEN, Amunatequi, 95, Cassila, 188-D, Santiago, Chile ;4.Departamento de Física/CCE/UEL, Campus Universitário, CP 6001, CEP, 86051-970, Londrina, Paraná, Brazil ;5.Departamento de Recursos Hidricos/FEC/UNICAMP, Campus Uniuersitário, CP 6021, CEP, 13081-970, Campinas, S?o Paulo, Brazil ; |
| Abstract: | An X-ray tube with a Mo target and Zr filter, operated at 45 kV/20 mA, was used to excite samples (5 ΜL deposited on a quartz support) and the total reflection angle condition was obtained with a double reflector module built with two 10-cm-long 7-mm-thick quartz crystals placed 50 Μm apart. A high-resolution spectrometer based on a Si(Li) detector coupled to a multichannel analyzer was used for X-ray detection and the spectra were interpreted with the AXIL software. The system was calibrated with standard chemical solutions containing Cr, Fe, Cu, Zn, and Pb, and Y was used as an internal standard to correct eventual geometric errors and high-voltage instabilities of the X-ray generator. The limits of detection were 19, 9, 5, and 4 ng/mL for Cr, Fe, Cu, and Zn, respectively, analyzed through characteristicKk α X-rays, and 7 ng/mL for Pb, throughLk α X-rays, considering 50 ΜL samples deposited and dried on a quartz support, to be excited/ detected for 1000 s. |
| Keywords: | Total reflection x-ray fluorescence TXRF XRF ED-XRF instrumental analysis |
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