首页 | 本学科首页   官方微博 | 高级检索  
     

智力低下患者的手纹分析
引用本文:花兆合,周伍,杨超,张贺京,王媛,李志红,孙凯. 智力低下患者的手纹分析[J]. 人类学学报, 2002, 21(3): 239-244
作者姓名:花兆合  周伍  杨超  张贺京  王媛  李志红  孙凯
作者单位:1. 安徽师范大学生命科学学院,芜湖,241000
2. 安徽省立医院,合肥,230001
3. 合肥市福利院,合肥,230068
摘    要:本文对安徽合肥和芜湖地区284例(男145人,女139人)2-59岁智力低下患者的手纹进行了分析。结果表明:患者的皮纹参数与正常对照组有明显的统计学差异,其中尺箕、箕/箕组合、帐弓、皮纹密度、atd角、t距比、掌褶通贯型、悉尼型、过渡Ⅰ型和小指短小类型等项参数均高于对照组(P<0.01);而简斗、斗/斗组合、a-dRC、t-dRC低于对照组(P<0.01),a-bRC亦低于对照组(P<0.05)。这些皮纹参数可以作为智力低下患者的辅助诊断指标。

关 键 词:智力低下患者 手纹分析 皮纹学 汉族
文章编号:1000-3193(2002)03-0239-06
修稿时间:2000-12-20

AN ANALYSES OF HAND DERMATOGLYPHICS OF A SUFFERER FROM HYPOPHRENIA
HUA Zhao-he ,ZHOU Wu ,YONG Chao ,ZHANG He-jing ,WANG Yuan ,LI Zhi-hong ,SUN Kai. AN ANALYSES OF HAND DERMATOGLYPHICS OF A SUFFERER FROM HYPOPHRENIA[J]. Acta Anthropologica Sinica, 2002, 21(3): 239-244
Authors:HUA Zhao-he   ZHOU Wu   YONG Chao   ZHANG He-jing   WANG Yuan   LI Zhi-hong   SUN Kai
Affiliation:HUA Zhao-he 1,ZHOU Wu 1,YONG Chao 1,ZHANG He-jing 1,WANG Yuan 1,LI Zhi-hong 2,SUN Kai 3
Abstract:A dermatoglyphic features of a sufferer from hypophrenia in Hefei and Wuhu urban districts, Anhui Province were analysed. There are 284 persons in this sample including 145 males and 139 females, aged 2-59 years. The results showed some statistical differences in the dermatoglyphic parameters between the sufferer from hypophrenia and control group. The ulanr loop(L u), combination of Loop and Loop (L/L), tented arch (A t), dermaloglyphic density, atd angle, percent distance of axial triadius (tPD), single flexion crease, sydney line, transitional type I and small type on the little finge in the sufferer from hypophrenia are more abundand than those in control (P<0.01). Simple whorl(W s), combination of whorl and whorl (W/W),a-dRC, t-dRC in the sufferer from hypophrenia are less than control(P<0.01). a-bRC is less too (P<0.05). The dermatoglyphic features can be used as auxiliary indicators in diagnosing hypophrenia.
Keywords:Dermatoglyphics  Intelligence  Hypophrenia  Han nationality
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号