An improved model for analyzing the small angle x-ray scattering of starch granules

The structure of starch was studied using small-angle x-ray scattering (SAXS). The scattering data was modeled by considering a finite stack of alternating lamellae that are allowed to fluctuate both along the layer repeat direction and along the transverse layer direction. Analysis in this way of the SAXS data from starch allowed fresh insights into the native structure of several starch species, particularly potato starch. The novel model presented in this work was able to capture the experimentally observed SAXS patterns much better than previous models, which did not incorporate transverse layer fluctuations.