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Classifying Response Correctness across Different Task Sets: A Machine Learning Approach
Authors:Thorsten Plewan  Edmund Wascher  Michael Falkenstein  Sven Hoffmann
Affiliation:1. Leibniz Research Centre for Working Environment and Human Factors–Department of Ergonomics, Dortmund, Germany;2. German Sport University Cologne–Institute of Psychology–Department of Performance Psychology, Cologne, Germany;ghent university, BELGIUM
Abstract:Erroneous behavior usually elicits a distinct pattern in neural waveforms. In particular, inspection of the concurrent recorded electroencephalograms (EEG) typically reveals a negative potential at fronto-central electrodes shortly following a response error (Ne or ERN) as well as an error-awareness-related positivity (Pe). Seemingly, the brain signal contains information about the occurrence of an error. Assuming a general error evaluation system, the question arises whether this information can be utilized in order to classify behavioral performance within or even across different cognitive tasks. In the present study, a machine learning approach was employed to investigate the outlined issue. Ne as well as Pe were extracted from the single-trial EEG signals of participants conducting a flanker and a mental rotation task and subjected to a machine learning classification scheme (via a support vector machine, SVM). Overall, individual performance in the flanker task was classified more accurately, with accuracy rates of above 85%. Most importantly, it was even feasible to classify responses across both tasks. In particular, an SVM trained on the flanker task could identify erroneous behavior with almost 70% accuracy in the EEG data recorded during the rotation task, and vice versa. Summed up, we replicate that the response-related EEG signal can be used to identify erroneous behavior within a particular task. Going beyond this, it was possible to classify response types across functionally different tasks. Therefore, the outlined methodological approach appears promising with respect to future applications.
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