首页 | 本学科首页   官方微博 | 高级检索  
   检索      


Modelling wheat growth and yield losses from late epidemics of foliar diseases using loss of green leaf area per layer and pre-anthesis reserves
Authors:Bancal Marie-Odile  Robert Corinne  Ney Bertrand
Institution:Environnement et Grandes Cultures, INRA, F-78 850 Thiverval Grignon, France. mobancal@grignon.inra.fr
Abstract:BACKGROUND AND AIMS: Crop protection strategies, based on preventing quantitative crop losses rather than pest outbreaks, are being developed as a promising way to reduce fungicide use. The Bastiaans' model was applied to winter wheat crops (Triticum aestivum) affected by leaf rust (Puccinia triticina) and Septoria tritici blotch (STB; Mycosphaerella graminicola) under a range of crop management conditions. This study examined (a) whether green leaf area per layer accurately accounts for growth loss; and (b) whether from growth loss it is possible to derive yield loss accurately and simply. Methods Over 5 years of field experiments, numerous green leaf area dynamics were analysed during the post-anthesis period on wheat crops using natural aerial epidemics of leaf rust and STB. Key Results When radiation use efficiency (RUE) was derived from bulk green leaf area index (GLAI), RUE(bulk) was hardly accurate and exhibited large variations among diseased wheat crops, thus extending outside the biological range. In contrast, when RUE was derived from GLAI loss per layer, RUE(layer) was a more accurate calculation and fell within the biological range. In one situation out of 13, no significant shift in the RUE(layer) of diseased crops vs. healthy crops was observed. A single linear relationship linked yield to post-anthesis accumulated growth for all treatments. Its slope, not different from 1, suggests that the allocation of post-anthesis photosynthates to grains was not affected by the late occurring diseases under study. The mobilization of pre-anthesis reserves completely accounted for the intercept value. Conclusions The results strongly suggest that a simple model based on green leaf area per layer and pre-anthesis reserves can predict both growth and yield of wheat suffering from late epidemics of foliar diseases over a range of crop practices. It could help in better understanding how crop structure and reserve management contribute to tolerance of wheat genotypes to leaf diseases.
Keywords:Triticum aestivum  Puccinia triticina  Mycosphaerella graminicola  leaf rust  Septoria tritici blotch  growth loss  yield loss  green leaf area per layer  pre-anthesis reserves
本文献已被 PubMed Oxford 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号