On the effect of surface active agents and their structure on the temperature-induced changes of normal and waxy wheat starch in aqueous suspension. Part I. Pasting and calorimetric studies

Pasting and calorimetric studies of normal and waxy wheat starch were performed in the presence of a series of ionic (sulphates, trimethyl ammonium bromides) and non-ionic (monoglycerides, maltosides) short (12 carbon atoms) and long (16 carbon atoms) n-alkyl chain surfactants. With the exception of the alkyl ammonium bromides, all of the short chain surfactants lower the pasting temperature (PT) in normal wheat starch, while the long chain surfactants have the opposite effect. Contrary, regardless of their chain length, all ionic surfactants lower the PT in waxy wheat starch while the non-ionic surfactants induce small, sometimes almost negligible changes in the PT. Calorimetric studies revealed the absence of a direct connection between the effect of surfactants on the onset of the starch gelatinization transition and the PT. However, in the presence of all surfactants, except the alkyl ammonium bromides, the PT of normal wheat starch was found to lie within or very close the temperature range within which the dissociation of the amylose–surfactant complexes takes place. Waxy wheat starch, in contrast, pasted at temperatures that fell within the temperature range of the starch gelatinization transition. This is taken as evidence of the existence of a correlation between the PT and the dissociation of the amylose–surfactant complexes.