首页 | 本学科首页   官方微博 | 高级检索  
   检索      


Characterization of a set of X-linked sequences and of a panel of somatic cell hybrids useful for the regional mapping of the human X chromosome
Authors:Oberlé  I  Camerino  G  Kloepfer  C  Moisan  J P  Grzeschik  K H  Hellkuhl  B  Hors-Cayla  M C  Van Cong  N  Weil  D  Mandel  J L
Institution:(1) Laboratoire de Génétique Moléculaire des Eucaryotes du CNRS, U. 184 de Biologie Moléculaire et de Génie Génétique de l'INSERM, 11, rue Humann, F-67085 Strasbourg, France;(2) Dipartimento di Genetica e Microbiologia, Pavia, Italy;(3) Institut für Humangenetik der Universität, D-4400 Münster, Federal Republic of Germany;(4) INSERM U. 12, Hôpital des Enfants Malades, Paris, France
Abstract:Summary We have characterized 19 DNA fragments originating from the human X chromosome. Most of them have been isolated from an X chromosome genomic library (Davies et al. 1981) using a systematic screening procedure. These DNA probes have been used to search for restriction fragment length polymorphisms (RFLP). The frequency of restriction polymorphisms (1 per 350 bp analysed) was lower than expected from data obtained with autosomal fragments. The various probes have been mapped within 12 subchromosomal regions using a panel of human-rodent hybrid cell lines. The validity of the panel was established by hybridization experiments performed with 27 X-specific DNA probes, which yielded information on the relative position of translocation break-points on the X chromosome. The DNAs from the various hybrid lines are blotted onto a reusable support which allows one to quickly map any new X-specific DNA fragment. The probes already isolated should be of use to map unbalanced X chromosome aberrations or to characterize new somatic cell hybrid lines. The probes which detect RFLPs define new genetic markers which will help to construct a detailed linkage map of the human X chromosome, and might also serve for the diagnosis of carriers or prenatal diagnosis.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号