Non-equivalence of YEPD and synthetic complete media in yeast reversion studies |
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Authors: | M.S.S. Murthy B.S. Rao N.M.S. Reddy P. Subrahmanyam U. Madhvanath |
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Affiliation: | Division of Radiological Protection, Bhabba Atomic Research Centre, Trombay, Bombay 400085, India |
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Abstract: | In yeast reversion studies, assay of the total number of cells is made by plating irradiated cells on agar plates containing yeast extract, peptone and dextrose (YEPD) medium. The number of revertants are scored by plating cells on synthetic complete (SC) medium deficient in the particular nutrient for which the reversion is tested. In this procedure equivalence for cell survival between the YEPD and the SC media is always assumed. However it is shown in this paper that this assumption is valid only up to dose levels where cell killing is not significant. At high doses, survivals on the two media differ significantly from each other for both high and low LET radiations. This difference influences the slope of the reversion frequency curve at high doses. Since the reversion frequency is expressed with reference to the number of survivors after a given radiation dose, it is essential to see that the same chance of survival is offered to the reverted and unreverted cells.Even though reversion is reported to vary linearly with dose, it is found that this linearity is restricted only to dose levels where cell killing is not significant. At higher doses, the reversion frequency varies in a very complex manner with dose for both high and low LET radiations. The complexity depends further on the reference medium chosen. |
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Keywords: | LET linear energy transfer SC synthetic complete YEPD yeast extract peptone dextrose |
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