Ellipsometric Investigation of the Shape of Nanodomains in Polymer/Fullerene Films |
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| Authors: | Sebastian Engmann Vida Turkovic Gerhard Gobsch Harald Hoppe |
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| Affiliation: | Institute of Physics, University of Technology Ilmenau, Weimarer Strasse 32, D‐98693 Ilmenau, Germany |
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| Abstract: | The influence of the polymer/fullerene blend ratio on the morphological properties of organic solar cells is investigated. Spectroscopic ellipsometry is applied as a tool for analyzing fullerene domains and the influence on polymer crystallinity within the film. Furthermore, the measurements are correlated with a percolation limit of as‐cast films at around 40 wt% fullerene content. |
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| Keywords: | effective medium approximation fullerenes graded layers optical anisotropy polymers |
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