Studying the effect of a charged surface on the interaction of bleomycin with DNA using an atomic force microscope |
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Authors: | Olivier Piétrement David Pastré Fabrice Landousy Marie-Odile David Stéphane Fusil Loïc Hamon Alain Zozime Eric Le Cam |
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Affiliation: | (1) Laboratoire de Microscopie Moléculaire et Cellulaire, UMR 8126 CNRS-IGR-UPS, Institut Gustave-Roussy, 39 rue Camille Desmoulins, 94805 Villejuif Cedex, France;(2) Laboratoire détude des Milieux Nanométriques, Université dEvry, Rue du Père Jarlan, 91025 Évry Cedex, France |
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Abstract: | The cleavage of DNA caused by the antitumoral drug bleomycin has been investigated using atomic force microscopy (AFM). This work deals with the effect that adsorbing DNA onto a positively- or negatively-charged surface has on the double-strand cleavage of DNA by Fe(III)/bleomycin. Quantitative analysis of the number of breaks per DNA molecule, in bulk and at the surface of the mica substrate, has been performed by analyzing AFM images. It turns out that the cleavage of DNA is strongly inhibited by a positively-charged surface. Our experiments can be interpreted using a simple electrostatic model. This paper is a first step in the study of DNA accessibility to ligand such as bleomycin, using AFM in liquids.Olivier Piétrement and David Pastré have contributed equally to the work. |
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Keywords: | Bleomycin DNA cleavage Atomic force microscope Surface |
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