|
|||||
|
|
Turnover of fear engram cells by repeated experience |
|
| Affiliation: | 1. Department of Biological Sciences, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Korea;2. KAIST Institute for the BioCentury (KIB), Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Korea;3. Center for Synaptic Brain Dysfunctions, Institute for Basic Science (IBS), Daejeon 34141, Korea |
| Abstract: |  |
| Keywords: | memory engram repeated experience memory update fear memory lateral amygdala optogenetics engram labeling |
| 本文献已被 ScienceDirect 等数据库收录！ | |