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A test of fit for a semiparametric additive risk model |
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| Authors: | YUEN K C; BURKE M D |
| Institution: | Department of Statistics, The University of Hong Kong Hong Kong e-mail: kcyuen{at}hkuce.hku.hk Department of Mathematics and Statistics, University of Calgary Calgary, Alberta T2N 1N4, Canada e-mail: mdburke{at}acs.ucalgary.ca |
| Abstract: | |
| Keywords: | Additive risk Baseline hazard function Bootstrap Cumulative hazard Empirical process Gaussian process Goodness of fit Random censorship Survival times |
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