Calculation of tilt angles for crystal specimen orientation adjustment using double-tilt and tilt-rotate holders

In this communication we wish to present a group of new equations which can be used to calculate the tilt angle for crystal specimen orientation adjustment in the transmission electron microscope. The experiments were concerned with double-tilt and tilt-rotate holders and the new equations deduced using matrix geometry. The specimen orientation adjustment using the tilt angles calculated by these equations is considered to be more convenient and less time-consuming than following the Kikuchi map method. Our method avoids the difficulties associated with orientation adjustment of severely strained and small grain size specimens using the Kikuchi map procedure. The algorithms for deducing the new equations, together with an experimental example using the equations, are described.