首页 | 本学科首页   官方微博 | 高级检索  
   检索      


Measurements of the X-Ray Line Spectrum of a Micropinch Source by a High-Sensitive Track Detector
Authors:Dolgov  A N  Klyachin  N A  Prokhorovich  D E
Institution:1.Dukhov All-Russia Research Institute of Automatics, 127055, Moscow, Russia
;2.National Research Nuclear University “MEPhI”, 115409, Moscow, Russia
;
Abstract:Plasma Physics Reports - The efficiency of the diffusion chamber as a tool for diagnostics of pulsed high-temperature plasma in a single discharge is demonstrated. Creation of a diffusion chamber...
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号