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Diverse approaches to achieving grain yield in wheat
Authors:Roberto A Barrero  Matthew Bellgard  Xueyong Zhang
Institution:(1) Centre for Comparative Genomics, Murdoch University, Murdoch, WA, 6150, Australia;(2) Key Laboratory of Crop Germplasm and Utilization, Institute of Crop Sciences, Chinese Academy of Agricultural Sciences, Beijing, 100081, China;
Abstract:Artificial selection (domestication and breeding) leaves a strong footprint in plant genomes. Second generation high throughput DNA sequencing technologies make it possible to sequence the gene complement of a plant genome within 3 to 5 months, and the costs of doing so are declining very quickly. This makes it practical to identify genomic regions that have undergone very strong selection. Available reference sequences of important crops such as rice, maize, and sorghum will promote the wide use of re-sequencing strategies in these crops. Marker/trait associations, especially haplotype (or haplotype block) association analyses, will help the precise mapping of important genomic regions and location of favored alleles or haplotypes for breeding. This mini-review examines a genomics approach to defining yield traits in wheat.
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