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Total internal reflection fluorescence microscopy: application to substrate-supported planar membranes
Authors:Nancy L. Thomson  Kenneth H. Pearce  Helen V. Hsieh
Affiliation:(1) Department of Chemistry, University of North Carolina, 27599-3290 Chapel Hill, NC, USA
Abstract:The use of total internal reflection illumination in fluorescence microscopy (TIRFM) is reviewed with emphasis on application to fluorescent macromolecules that specifically and reversibly bind to planar model membranes supported on glass or quartz substrates. Several methods for characterizing macromolecular motion and organization are discussed: the measurement of equilibrium binding curves to obtain values for equilibrium binding constants; the measurement of fluorescence photobleaching recovery curves to obtain values of kinetic rate constants and surface diffusion coefficients; and the measurement of fluorescence intensities as a function of the evanescent field polarization to characterize orientational order. Applications to cell-substrate contact regions are summarized and future directions of TIRFM are outlined.Correspondence to: N. L. Thompson
Keywords:Evanescent field  Surface diffusion  Receptor-ligand interactions  Fluorescence photobleaching recovery  Fluorescence correlation spectroscopy
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