Stripe rust analysis of D-genome synthetic wheats (2n = 6x = 42, AABBDD) and their molecular diversity

Stripe or yellow rust caused by Puccinia striiformis f. sp. tritici is a threat to many of the existing cultivars of Pakistan. Many attempts are being made to evolve new varieties resistant to stripe rust to reduce the losses caused by this disease. For this purpose, novel genes are needed to incorporate into the existing cultivars. These genes are found in the wild progenitors of wheat that are D-genome donors to wheat. As a result of extensive research, wheat synthetic hexaploids have been developed. These synthetics have resistances against biotic as well as abiotic stresses including the yellow rust. A group of such synthetics has been identified which seems resistant to this destructive disease. This group was tested under field conditions to identify resistance against stripe rust. The same population was analysed at molecular level to explore the genetic diversity for rust resistance. Genetic diversity among 34 selected synthetic hexaploid wheats was studied by random amplified polymorphic DNA (RAPD) analysis. A set of 12 RAPD primers was applied, and the level of polymorphism was found to be 46.67%. The coefficients in the range of 71–100% were detected by genetic similarity matrix based on Nei and Li's index. These coefficients were used for constructing a dendrogram using unweighted pair group of arithmetic means. Synthetic hexaploid line 34 was found to exhibit maximum genetic distances among the 34 selected lines. The same accession also showed excellent phenotypic characters with above average grain weight. These synthetic hexaploids carrying genetic potential for stripe rust resistance and morphological traits should be useful for improvement of existing wheat cultivars.