Leaf yield loss assessment due to Macrophomina root rot disease in mulberry gardens of south India |
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| Authors: | N B Chowdary Govindaiah |
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| Institution: | 1. Mulberry Pathology Section , Central Sericultural Research and Training Institute , Mysore, 570 008, India balaji_narishetty@yahoo.com;3. Department of Sericulture , Bangalore University , Bangalore, 560 056, India |
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| Abstract: | Abstract Leaf yield loss in mulberry due to Macrophomina root rot disease was assessed in three different states of south India at field level. The highest leaf yield loss recorded was in V-1 variety (34.74%), whereas the lowest leaf yield loss was in K-2 variety (28.54%). However, the leaf yields losses in other varieties viz., MR-2 (32.90%), S-36 (32.06%), RFS-175 (31.75%) and S-13 (29.0%) recorded were medium. The average leaf yield loss was 31.49% due to root rot disease caused by M. phaseolina in mulberry. |
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| Keywords: | Root rot Macrophomina leaf yield mulberry disease |
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