Association of morphological and biochemical features of mulberry lines with resistance to bacterial leaf spot |
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Authors: | Rita Banerjee Soumen Chattopadhyay Atul Kumar Saha S Nirmal Kumar |
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Institution: | 1. Central Sericultural Research and Training Institute, Central Silk Board, Ministry of Textiles: Govt. of India, Berhampore, Indiarita_csb@rediffmail.com;3. Central Sericultural Research and Training Institute, Central Silk Board, Ministry of Textiles: Govt. of India, Berhampore, India |
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Abstract: | Xanthomonas campestris pv. mori causes bacterial leaf spot (BLS) of mulberry (Morus spp.) worldwide. Twenty mulberry lines with contrasting response to BLS showed significant (p?<?0.01) variation between resistant and susceptible groups for stomata frequency (SF), trichome density (TD), total soluble sugar (TSS) and polyphenol (PP) content, while non-significant for chlorophyll content. Heritability (broad-sense) estimates obtained from the variance component analysis were high (≥0.72) for these traits. The disease severity index values of the lines were significantly negatively correlated with TD (r?=??0.66; p?<?0.01), TSS (r?=??0.73; p?<?0.01) and PP (r?=??0.61; p?<?0.01), while positively correlated with SF (r?=?0.65; p?<?0.01). The cluster analysis was based on highly significant four variables and DSI values, and classified the lines into two major clusters. The resistant lines that come under cluster-I had high TD, TSS and PP, while those in susceptible category had high SF in cluster-II. These findings suggest that direct selection for SF, TD, TSS and PP will be effective for development of host resistance against BLS in mulberry. |
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Keywords: | correlation cluster genetics host resistance improvement Morus spp |
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