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Association of morphological and biochemical features of mulberry lines with resistance to bacterial leaf spot
Authors:Rita Banerjee  Soumen Chattopadhyay  Atul Kumar Saha  S Nirmal Kumar
Institution:1. Central Sericultural Research and Training Institute, Central Silk Board, Ministry of Textiles: Govt. of India, Berhampore, Indiarita_csb@rediffmail.com;3. Central Sericultural Research and Training Institute, Central Silk Board, Ministry of Textiles: Govt. of India, Berhampore, India
Abstract:Xanthomonas campestris pv. mori causes bacterial leaf spot (BLS) of mulberry (Morus spp.) worldwide. Twenty mulberry lines with contrasting response to BLS showed significant (p?<?0.01) variation between resistant and susceptible groups for stomata frequency (SF), trichome density (TD), total soluble sugar (TSS) and polyphenol (PP) content, while non-significant for chlorophyll content. Heritability (broad-sense) estimates obtained from the variance component analysis were high (≥0.72) for these traits. The disease severity index values of the lines were significantly negatively correlated with TD (r?=??0.66; p?<?0.01), TSS (r?=??0.73; p?<?0.01) and PP (r?=??0.61; p?<?0.01), while positively correlated with SF (r?=?0.65; p?<?0.01). The cluster analysis was based on highly significant four variables and DSI values, and classified the lines into two major clusters. The resistant lines that come under cluster-I had high TD, TSS and PP, while those in susceptible category had high SF in cluster-II. These findings suggest that direct selection for SF, TD, TSS and PP will be effective for development of host resistance against BLS in mulberry.
Keywords:correlation  cluster  genetics  host resistance  improvement  Morus spp  
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