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Partial internal reflections on total internal reflection fluorescent microscopy
Authors:Sanford M. Simon
Affiliation:1. Department of Laboratory Medicine, the First Affiliated Hospital of Nanjing Medical University, Nanjing 210029, China;2. Advanced Photonics Center, Southeast University, Nanjing 210096, China;1. Department of Orthopedic Surgery, Tokyo Medical University, 6-7-1 Nishishinjuku, Shinjuku-ku, Tokyo 160-0023, Japan;2. Department of Bone and Joint Biomaterial Research, Tokyo Medical University, 6-7-1 Nishishinjuku, Shinjuku-ku, Tokyo 160-0023, Japan;1. Department of Electrical & Computer Engineering, University of Manitoba, 75A Chancellors Circle, Winnipeg, Manitoba R3T 5V6 Canada;2. High Voltage Test Facility, Manitoba Hydro, 1510 Chevrier Blvd., Winnipeg, Manitoba R3T 1Y6, Canada;1. Department of Experimental Pathology, Beijing Institute of Radiation Medicine, Beijing 100850, China;2. Department of Pathology, Beiya Orthopedic Hospital, Beijing 100102, China
Abstract:
Keywords:
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