Intraspecific genetic variability analysis of Neovossia indica causing Karnal bunt of wheat using repetitive elements |
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Authors: | R Datta M D Rajebhosale H S Dhaliwal H-Singh P K Ranjekar V S Gupta |
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Institution: | (1) Plant Molecular Biology Unit, Division of Biochemical Sciences, National Chemical Laboratory, Pune 411008, India e-mail:Vidya@ems.ncl.res.in Fax: +91-020-5884032, IN;(2) Biotechnology Centre, Punjab Agricultural University, Ludhiana 141004, India, IN |
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Abstract: | Neovossia indica (Tilletia indica), causing Karnal bunt of wheat, affects major wheat growing regions all over the world. Karnal bunt ranks as one of the major
diseases of wheat causing quality losses and monetary losses due to international quarantine regulations. The present work
is the first report of a genetic diversity analysis of Indian isolates of N. indica. A library of N. indica isolate Ni7 was constructed in a λZAPII system, and three repetitive elements were identified for molecular analysis. These
repetitive elements generated complex hybridization profiles producing fingerprint patterns of all seven isolates. Copy-number
estimation of these three elements, pNiR9, pNiR12 and pNiR16, indicated the presence of 32, 61 and 64 copies, respectively.
Cluster analysis based on hybridization patterns grouped together moderately virulent isolates Ni1, Ni7 and Ni8, thus suggesting
a positive correlation between virulence typing and cluster analysis based on molecular data. Variability analysis of N. indica isolates will aid in checking new resistant sources in host germplasm.
Received: 20 April 1999 / Accepted: 29 July 1999 |
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Keywords: | Karnal bunt Repetitive elements Genome diversity RFLP |
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