A method for determining the crystal orientation for any tilt position when using a transmission electron microscope double-tilt specimen holder |
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| Institution: | 1. National University of Science and Technology “MISIS”, SHS Research & Education Center MISIS-ISMAN, Leninsky Prospect, 4, Moscow, 119049 Russia;2. OAO “Kompozit”, Pionerskay, 4, Moscow region, Korolev city, Russia;1. Institute of Chemistry of the Far Eastern Branch of Russian Academy of Sciences, 159 Pr. 100-letiya Vladivostoka, Vladivostok 690022, Russia;2. Far Eastern Federal University, 8 Sukhanova St., Vladivostok, 690091, Russia |
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| Abstract: | A method is described in this short communiction which provides a rapid and precise determination of the crystal specimen orientation in any tilt position when using a doule-tilt holder in the transmission electron microscope (TEM). It is necessary to establish three pairs of tilt angles (αi, βi) (i = 1, 2, 3) where three recognized directions of the crystal specimen are aligned to the electron beam direction respectively, in order to determine the crystal specimen orientation for any tilt position in a double-tilt specimen holder. In addition, the tilt position (α, β), where any orientation u v w] is aligned to the beam direction, can be determined with the aid of this method.A software system for computer applications of the above method has beed developed. |
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