Differentiation of Wheat Diseases and Pests Based on Hyperspectral Imaging Technology with a Few Specific Bands

Hyperspectral imaging technique is known as a promising non-destructive way for detecting plants diseases and pests. In most previous studies, the utilization of the whole spectrum or a large number of bands as well as the complexity of model structure severely hampers the application of the technique in practice. If a detection system can be established with a few bands and a relatively simple logic, it would be of great significance for application. This study established a method for identifying and discriminating three commonly occurring diseases and pests of wheat, i.e., powdery mildew, yellow rust and aphid with a few specific bands. Through a comprehensive spectral analysis, only three bands at 570, 680 and 750?nm were selected. A novel vegetation index namely Ratio Triangular Vegetation Index (RTVI) was developed for detecting anomalous areas on leaves. Then, the Support Vector Machine (SVM) method was applied to construct the discrimination model based on the spectral ratio analysis. The validating results suggested that the proposed method with only three spectral bands achieved a promising accuracy with the Overall Accuracy (OA) of 83%. With three bands from the hyperspectral imaging data, the three wheat diseases and pests were successfully detected and discriminated. A stepwise strategy including background removal, damage lesions recognition and stresses discrimination was proposed. The present work can provide a basis for the design of low cost and smart instruments for disease and pest detection.