Improvement of the morphometry method and its use in electron microscopic studies |
| |
Authors: | V V Sirotkin N D Volodin |
| |
Abstract: | The paper describes morphometric device for electron microscope. Using this gauge one can get morphometric data from the screen of the electron microscope. Perspectives of morphometric analysis of ultra-structures in the electron microscope are discussed. |
| |
Keywords: | |
|
|