首页 | 本学科首页   官方微博 | 高级检索  
     


Improvement of the morphometry method and its use in electron microscopic studies
Authors:V V Sirotkin  N D Volodin
Abstract:The paper describes morphometric device for electron microscope. Using this gauge one can get morphometric data from the screen of the electron microscope. Perspectives of morphometric analysis of ultra-structures in the electron microscope are discussed.
Keywords:
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号