首页 | 本学科首页   官方微博 | 高级检索  
     


Microwave-Assisted Growth of Silver Nanoparticle Films with Tunable Plasmon Properties and Asymmetrical Particle Geometry for Applications as Radiation Sensors
Authors:Guidelli  E. J.  Araujo  L. F.  Assunção  A. C. A.  Carvalho  I. C. S.  Clarke  D. R.  Baffa  O.
Affiliation:1.Departamento de Física, FFCLRP-Universidade de São Paulo, Ribeirão Preto, SP, 14040-901, Brazil
;2.School of Engineering and Applied Sciences, Harvard University, Cambridge, MA, 02138, USA
;3.Departamento de Física, Pontifícia Universidade Católica, Rio de Janeiro, RJ, 22451-900, Brazil
;
Abstract:

We report a simple and fast microwave-assisted method to grow silver nanoparticle films with tunable plasmon resonance band. Microwaving time controls nucleation and growth as well as particle agglomeration, cluster formation, particle morphology, and the plasmonic properties. Films produced with times shorter than 30 s presented a single well-defined plasmon resonance band (~ 400 nm), whereas films produced with times longer than 40 s presented higher wavelength resonances modes (> 500 nm). Plasmon band position and intensity can be easily tuned by controlling microwaving time and power. SEM and AFM images suggested the growth of asymmetrical silver nanoparticles. Simulated extinction spectra considering particles as spheres, hemispheres, and spherical caps were performed. The films were employed to enhance the sensitivity of ionizing radiation detectors assessed by optically stimulated luminescence (OSL) via plasmon-enhanced luminescence. By tuning the plasmon resonance band to overlap with the OSL stimulation (530 nm), luminescence enhancements of greater than 100-fold were obtained, demonstrating the importance of tuning the plasmon resonance band to maximize the OSL intensity and detector sensitivity. This versatile method to produce silver nanoparticle films with tunable plasmonic properties is a promising platform for developing small-sized radiation detectors and advanced sensing technologies.

 loading=

Graphical Abstract

Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号