首页 | 本学科首页   官方微博 | 高级检索  
   检索      


Kinetics of growth, oxygen uptake, and substrate utilization of wild type and genetically engineeredBurkholderia sp
Authors:Juho So  Krishna R Pagilla  Hyungjin Kim  Benjamin C Stark
Institution:(1) Department of Chemical and Environmental Engineerign, Illinois Institute of Technology, 60616 Chicago, IL, U.S.A.;(2) Department of Biological, Chemical, and Physical Sciences, Illinois Institute of Technology, 60616 Chicago, IL, U.S.A.
Abstract:The gene (vgb) encoding the hemoglobin (VHb) ofVitreoscilla sp. was cloned intoBurkholderia sp. and the effect of VHb on the growth characteristics of genetically engineeredBurkholderia (YV1) were compared with wild typeBurkholderia (R34) using continuous flow reactors (chemostat) at various dilution rates under aerobic conditions. Batch oxygen uptake rate showed that YV1 has much higher oxygen uptake rate than R34 (i.e. 0.63 mg O2/g biomass/min vs. 1.43 mg O2/g biomass/min for R34 and YV1 respectively at a dilution rate of 1.2 day−1). Monod parameters, maximum growth rate (μmax) and half saturation coefficient (Ks) were found to be 7.03 day−1 and 691 mg/L for R34 respectively, compared to 5.49 day−1 and 404 mg/L for YV1 respectively. At low dilution rates (<2.5 day−1), when the substrate is present in low concentrations, the growth yield was much higher in YV1 (0.52) than in R34 (0.37). Although substrate utilization rates were similar between R34 and YV1, the latter showed much higher oxygen uptake rate than did R34 at all dilution rates. When the stability of VHb was tested on agar plates containing 40 μg/L of kanamycin and 100 μg/L of ampicillin,vgb gene containing VHb plasmid in YV1 was stable over 82 days. When survivability under oxygen limited conditions was tested, R34 survived only for 11 days whereas YV1 survived over 25 days in liquid media; in agar plate experiments, R34 did not survive more than 40 days whereas more than 75% of YV1 survived over 110 days.
Keywords:Burkholderia            hemoglobin  kinetics  chemostat
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号