| Abstract: | The change in dielectric properties caused by the destruction of the transport barrier of yeast cells has been investigated. Dielectric measurements were made over the frequency range of 1 kc to 2 Mc by using “leaky” yeast cells prepared by treatments with HgCl2 or CTAB (cetyl trimethyl ammonium bromide). The Hg-treated cells were observed to give smaller dielectric constants and lower critical frequencies as compared with that of the intact cells, while the CTAB-treated cells gave no clear-cut dielectric dispersion. These observations are interpreted on the basis of Maxwell-Wagner's theory as indicating the changes in the intracellular conductivity, the membrane capacitance and the membrane conductance. |
