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The dynamics of silicon deposition in the sorghum root endodermis
Authors:Alexander Lux  Miroslava Luxová  Jun Abe  Eiichi Tanimoto  Taiichiro Hattori  Shinobu Inanaga
Institution:Department of Plant Physiology, Faculty of Natural Sciences, Comenius University, Mlynskádolina B-2, 842 15 Bratislava, Slovak Republic;;Institute of Botany, Slovak Academy of Sciences, Dúbravskácesta 14, 842 23 Bratislava, Slovak Republic;;Department of Agricultural and Environmental Biology, Graduate School of Agricultural and Life Sciences, The University of Tokyo, Tokyo 113–8657, Japan;;Graduate School of Natural Sciences, Nagoya City University, Mizuho-ku, Nagoya 467–8501, Japan;and;Arid Land Research Center, Tottori University, 1390 Hamasaka, Tottori 680–0001, Japan
Abstract:
Keywords:endodermis  environmental scanning electron microscope (ESEM)  root  silicon (Si) deposition                Sorghum bicolor (sorghum)  X-ray microanalysis
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