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A statistical framework for genome-wide scanning and testing of imprinted quantitative trait loci
Authors:Cui Yuehua
Affiliation:Department of Statistics and Probability, Michigan State University, East Lansing, MI 48824, USA. cui@stt.msu.edu
Abstract:Non-equivalent expression of alleles at a locus results in genomic imprinting. In this article, a statistical framework for genome-wide scanning and testing of imprinted quantitative trait loci (iQTL) underlying complex traits is developed based on experimental crosses of inbred line species in backcross populations. The joint likelihood function is composed of four component likelihood functions with each of them derived from one of four backcross families. The proposed approach models genomic imprinting effect as a probability measure with which one can test the degree of imprinting. Simulation results show that the model is robust for identifying iQTL with various degree of imprinting ranging from no imprinting, partial imprinting to complete imprinting. Under various simulation scenarios, the proposed model shows consistent parameter estimation with reasonable precision and high power in testing iQTL. When a QTL shows Mendelian effect, the proposed model also outperforms traditional Mendelian model. Extension to incorporate maternal effect is also given. The developed model, built within the maximum likelihood framework and implemented with the EM algorithm, provides a quantitative framework for testing and estimating iQTL involved in the genetic control of complex traits.
Keywords:EM algorithm   Genomic imprinting   Maximum likelihood   Quantitative trait loci   Reciprocal backcross
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