Determination of the surface dose of a water phantom using a semiconductor detector for diagnostic kilovoltage x-ray beams |
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| Institution: | 1. Graduate School of Health Sciences, Kumamoto University, 4-24-1 Kuhonji, Chuo-ku, Kumamoto 862-0976, Japan;2. Department of Health Sciences, Faculty of Life Sciences, Kumamoto University, 4-24-1 Kuhonji, Chuo-ku, Kumamoto 862-0976, Japan;1. Department of Medical Physics, Hospital Universitario Ramón y Cajal, Madrid, Spain;2. Biomedical Engineering, ETSIT, Universidad Politécnica de Madrid, Madrid, Spain;3. Medical Physics, Department of Radiology, Rehabilitation and Physiotherapy, Universidad Complutense de Madrid, Madrid, Spain;1. International Atomic Energy Agency (IAEA), P.O. Box 100, 1400 Vienna, Austria;2. Bundesamt für Eich- und Vermessungswesen (BEV), Dosimetrielabor im Forschungszentrum Seibersdof, Austria;3. Greek Atomic Energy Commission (IRCL/GAEC-EIM), P.O. Box 60092, Agia Paraskevi, 15310 Attiki, Greece;4. IBA Dosimetry GmbH, Dosimetry Laboratory, Bahnhofstrasse 5, D-90592 Schwarzenbruck, Germany;5. National Metrology Institute of South Africa (NMISA), Private Bag X34, Lynnwood Ridge, Pretoria 0040, South Africa;6. Radiation and Nuclear Safety Authority (STUK), Laippatie 4, FI.00881 Helsinki, Finland;7. Instituto Superior Técnico, LPRS – Laboratório, Metrologia de Radiações Ionizantes (LMRI), Estrada Nacional 10, 2695-066 Bobadela LRS, Portugal;8. Czech Metrology Institute (CMI) Radiova 1, CZ 10200 Prague, Czech Republic;9. Swedish Radiation Safety Authority (SSM), Solna strandväg 96, SE-171 16 Stockholm, Sweden;10. Jozef Stefan Institute (IJS), Ljubljana, Jamova 39, SI-1000, Slovenia;11. King Faisal Specialist Hospital and Research Centre (KFSHRC), P.O. Box 3354, Riyadh 11211, Saudi Arabia;12. Radiation Control Department, Ministry of Health, Sheba Medical Center, Aharon Katsir Av. #7, Ramat-Gan, Israel;1. Qaelum NV, Gaston Geenslaan 9, 3001 Leuven, Belgium;2. University of Leuven, Department of Imaging and Pathology, Division of Medical Physics and Quality Assessment, Herestraat 49, 3000 Leuven, Belgium;3. Department of Radiology, University Hospitals Leuven, Herestraat 49, 3000 Leuven, Belgium;1. Medical Physics, San Raffaele Scientific Institute, Milano, Italy;2. Radiology, San Raffaele Scientific Institute, Milano, Italy;3. Internal Medecine, San Raffaele Scientific Institute, Milano, Italy;4. Faculty of Medecine and Surgery, Vita-Salute San Raffaele University, Milano, Italy |
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| Abstract: | PurposeTo determine the surface dose of a water phantom using a semiconductor detector for diagnostic kilovoltage x-ray beams.MethodsAn AGMS-DM+ semiconductor detector was calibrated in terms of air kerma measured with an ionization chamber. Air kerma was measured for 20 x-ray beams with tube voltages of 50–140 kVp and a half-value layer (HVL) of 2.2–9.7 mm Al for given quality index (QI) values of 0.4, 0.5, and 0.6, and converted to the surface dose. Finally, the air kerma and HVL measured by the AGMS-DM+ detector were expressed as a ratio of the surface dose for 10 × 10 and 20 × 20 cm2 fields. The ratio of both was represented as a function of HVL for the given QI values and verified by comparing it with that calculated using the Monte Carlo method.ResultsThe air kerma calibration factor, CF, for the AGMS-DM+ detector ranged from 0.986 to 1.016 (0.9% in k = 1). The CF values were almost independent of the x-ray fluence spectra for the given QI values. The ratio of the surface dose to the air kerma determined by the PTW 30,013 chamber and the AGMS-DM+ detector was less than 1.8% for the values calculated using the Monte Carlo method, and showed a good correlation with the HVL for the given QI values.ConclusionIt is possible to determine the surface dose of a water phantom from the air kerma and HVL measured by a semiconductor detector for given QI values. |
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| Keywords: | Surface dose measurement Semiconductor detector Diagnostic kilovoltage x-ray beams Quality index |
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