Multielement proton-induced X-ray emission analysis of betel leaves,betel nuts,and lime |
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Authors: | S A Tarafdar S Akhter S Kar S K Biswas A H Khan |
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Institution: | (1) Chernistry Division, Atomic Energy Centre, P. O. Box 164, Dhaka, Bangladesh |
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Abstract: | Proton-induced X-ray emission (PIXE) method was employed to study the concentration of heavy elements in betel leaves, betel
nuts, and mineral lime consumed in Bangladesh. The samples were collected from different parts of Bangladesh and analyzed
by the thicktarget external beam technique of the PIXE method. The samples were exposed to the proton beam as 1-mm thick pellets
and irradiated with 2.0-MeV protons having 20-nA beam intensity. The concentration of some 15 elements (K, Ca, Ti, V, Cr,
Mn, Fe, Ni, Cu, Zn, Se, Br, Rb, Sr, and Pb) was measured by comparison with a calibration curve constructed from the NBS orchard
leaf standard SRM 1571. The validity of the procedure has been established by comparative measurements of Cu and Zn with atomic
absorption spectrophotometry. The significance of the results is discussed in view of their implications in health and disease. |
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Keywords: | Trace and mineral element analysis in betel leaves betel nuts and lime PIXE and atomic absorption measurements Bangladeshi betel leaves betel nuts and lime analysis of heavy elements in thick target and external beam 2 00 MeV protons health-related environmental research PIXE |
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