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A mathematical model and a method for the practical assessment of the phyllotactic patterns
Affiliation:1. LAAS-CNRS, Université de Toulouse, 31000 Toulouse, France;2. Institute of Optical and Electronic Materials, Hamburg University of Technology, 21073 Hamburg, Germany;3. Helmholtz-Zentrum Hereon, Institute of Photoelectrochemistry, 21502 Geesthacht, Germany;4. Université Côte d′Azur, CRHEA-CNRS, Sophia Antipolis, 06560 Valbonne, France;5. Department of Physics and Engineering, ITMO University, 191002, St. Petersburg, Russia;1. University of the West of England, Bristol, United Kingdom;2. Rhode Island School of Design, Providence, RI, United States;1. Institute of Nano/photon Materials and Application & International Joint Research Laboratory of New Energy Materials and Devices of Henan Province, School of Physics and Electronics, Henan University, Kaifeng 475004, PR China;2. Key Laboratory for Physical Electronics and Devices of the Ministry of Education & School of Science & Shaanxi Key Lab of Information Photonic Technique & Institute of Wide Bandgap Semiconductors, Xi’an Jiaotong University, Xi’an 710049, PR China
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