Detection of protein-protein interactions on SiO2/Si surfaces by spectroscopic ellipsometry |
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Authors: | Kodera Seigo Okajima Toshihide Iwabuki Hidehiko Kitaguchi Daisuke Kuroda Shun'ichi Yoshinobu Tatsuo Tanizawa Katsuyuki Futai Masamitsu Iwasaki Hiroshi |
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Affiliation: | The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, Japan. |
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Abstract: | We have applied spectroscopic ellipsometry to sensitive detection of specific protein-protein interactions on SiO2/Si substrates. First, the change of ellipticity of the reflected polarized light (600-1100 nm) was correlated with the thickness of the protein layer immobilized on SiO2/Si surfaces by measuring monomeric (myoglobin) and homotetrameric (hemoglobin) proteins with a similar monomer size. Protein-protein interactions were then measured with the antigen/antibody and cell-surface receptor/ligand systems; in each system either of the two proteins was bound to SiO2/Si substrates. Consequently, significant ellipticity changes were observed only for the cases where the interactions were specific. A specific antibody binding was also detectable with an antigen displayed on the surface of bacteriophage particles. These results show the usefulness of spectroscopic ellipsometry for sensitive detection of protein-protein interactions and its applicability to a detection method for the protein-based biochips to be developed in the future. |
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Keywords: | Protein-protein interaction Spectroscopic ellipsometry Sensitive detection Biochips |
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