High-resolution genome-wide analysis of irradiated (UV and γ-rays) diploid yeast cells reveals a high frequency of genomic loss of heterozygosity (LOH) events 期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

High-resolution genome-wide analysis of irradiated (UV and γ-rays) diploid yeast cells reveals a high frequency of genomic loss of heterozygosity (LOH) events

作者姓名：	St Charles J Hazkani-Covo E Yin Y Andersen SL Dietrich FS Greenwell PW Malc E Mieczkowski P Petes TD

摘要：
收稿时间：	2011-12-16
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