首页 | 本学科首页   官方微博 | 高级检索  
     


Mapping quantitative trait loci controlling sheath blight resistance in two rice cultivars (Oryza sativa L.)
Authors:J. H. Zou  X. B. Pan  Z. X. Chen  J. Y. Xu  J. F. Lu  W. X. Zhai  L. H. Zhu
Affiliation:(1) Agriculture Collage, Yangzhou University, Yangzhou, Jiangsu, 225009, China, CN;(2) Institute of Genetics, Chinese Academy of Sciences, Beijing, 100101, China e-mail: lhzhu@ss10.igtp.ac.cn Fax: +86–10–64873428, CN
Abstract:Rice sheath blight, caused by Rhizoctonia solani Kühn, is one of the three major diseases of rice. The present study was conducted with an F2 clonal population of Jasmine 85/Lemont. The F2 population, including 128 clonal families, was inoculated by short toothpicks incubated with a strain, RH-9 of the fungus. Based on field disease evaluations in 2 years and a genetic map with 118 evenly distributed molecular markers, we identified six quantitative trait loci (QTLs) contributing to sheath blight resistance. These QTLs, qSB-2, qSB-3, qSB-7, qSB-9-1, qSB-9-2 and qSB-11, were located on chromosomes 2, 3, 7, 9 and 11, respectively. The respective alleles of qSB-2, qSB-3, qSB-7, and qSB-9-2 from Jasmine 85 could explain 21.2%, 26.5%, 22.2% and 10.1% of the total phenotypic variation, respectively; while the alleles of qSB-9-1 and qSB-11 from Lemont could explain 9.8% and 31.2% of the total phenotypic variation. Of these qSB-2 and qSB-11 could be detected in both years, while remaining loci were detected only in a single year. Furthermore, four QTLs (qHD-2, qHD-3, qHD-5 and qHD-7) controlling heading date and three QTLs (qPH-3, qPH-4 and qPH-11) controlling plant height were also identified. Though rice sheath blight resistance may be influenced by morphological traits, such as heading date and plant height, in the present study most detected resistance loci were not linked to the loci for heading date or plant height. Received: 1 September 1999 / Accepted: 24 January 2000
Keywords:  Rice  Sheath blight  F2 clonal population  QTLs for resistance
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号