A genetic study of x-ray sensitive mutants in yeast |
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Authors: | J C Game R K Mortimer |
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Affiliation: | Donner Laboratory, University of California, Berkeley, Calif. 94720 U.S.A. |
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Abstract: | A set of 64 mutants of Saccharomyces cerevisiae that confer sensitivity to X-ray inactivation were analyzed genetically to determine the number of genetic loci involved. The mode of interaction of various combinations of mutants was also determined. A minimum of 17 genes, when mutant, increase X-ray sensitivity of yeast, primarily by eliminating the resistance of budding haploid cells and by removing the shoulder on the survival curves of diploid cells. Eight mutant loci affect principally X-ray sensitivity while the remaining genes also control sensitivity to ultraviolet. Some of the genes when homozygous block sporulation or result in partial or complete sterility. Examination of the survival responses of multiple-mutant strains indicated a minimum of two pathways in the repair of X-ray damage. A number of the mutants have been mapped and these were found to be dispersed over the genome. |
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Keywords: | FDS first-division segregation NPD non-parental ditype PD parental ditype SDS second-division segregation T tetratype YEPD yeast extract peptone and glucose |
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