Tamm Plasmon Polariton as Refractive Index Sensor Excited by Gyroid Metals/Porous Ta2O5 Photonic Crystal

In this paper, a novel refractive index sensor in terahertz region is proposed. The proposed structure is prism/(sample/porousTa₂O₅)¹⁵/sample/gyroid metal/substrate. The sensor is based on the Tamm plasmon polariton at the interface between porous one-dimensional photonic crystal and gyroidal metal. The gyroidal metal has been used as an alternative metal and its refraction index can be tuned by the gyroid parameters. The effects of the metal volume fraction and sample refractive index on the performance are studied to improve the ability of the sensor. The proposed sensor achieves high sensitivity of 6.7 THz/RIU, a high figure of merit 6*10³ RIU^?1, a high-quality factor of 3*10³, and a low detection limit of 9*10^?6 RIU. The proposed device can be a good candidate for fabricating gyroid metal and porous material-based biosensors, active optoelectronic and polaritonic devices.