X-Ray radiography for studying diffusion characteristics of sucrose in plaster of paris matrix containing yeast cells |
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| Authors: | S. Ghosh K. N. Chandrasekharan D. N. Sah J. K. Ghosh |
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| Affiliation: | (1) Food Technology and Enzyme Engineering Division, Bhabha Atomic Research Centre, 400085 Bombay, India;(2) Radiometallurgy Division, Bhabha Atomic Research Centre, 400085 Bombay, India |
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| Abstract: | Summary X-Ray radiography was employed to monitor the diffusion of sucrose into plaster of Paris matrix containing 20% yeast cells. It was observed that the depth of penetration of tracer Pb detected by radiography matched with the substrate penetration detected by chemical test. However electron probe microanalysis (EPMA) did not yield any conclusive evidence regarding the movements of tracer Pb and substrate to the same extent. |
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