A unique combined and multi‐disciplinary wavelength multiplexed spectrometer is described. It is furnished with high‐sensitivity imaging plate detectors, the power to which can be gated to provide time‐resolved data. The system is capable of collecting spectrally resolved luminescence data following X‐ray excitation [radioluminescence (RL) or X‐ray excited optical luminescence (XEOL)], electron irradiation [cathodoluminescence (CL)] and visible light from light emitting diodes (LEDs) [photoluminescence (PL)]. Time‐resolved PL and CL data can be collected to provide lifetime estimates with half‐lives from microsecond timeframes. There are temperature stages for the high and low temperature experiments providing temperature control from 20 to 673 K. Combining irradiation, time resolved (TR) and TR‐PL allows spectrally‐resolved thermoluminescence (TL) and optically stimulated luminescence (OSL). The design of two detectors with matched gratings gives optimum sensitivity for the system. Examples which show the advantages and multi‐use of the spectrometer are listed. Potential future experiments involving lifetime analysis as a function of irradiation, dose and temperature plus pump‐probe experiments are discussed. 相似文献
Organic–inorganic hybrid perovskite solar cells with mixed cations and mixed halides have achieved impressive power conversion efficiency of up to 22.1%. Phase segregation due to the mixed compositions has attracted wide concerns, and their nature and origin are still unclear. Some very useful analytical techniques are controversial in microstructural and chemical analyses due to electron beam‐induced damage to the “soft” hybrid perovskite materials. In this study photoluminescence, cathodoluminescence, and transmission electron microscopy are used to study charge carrier recombination and retrieve crystallographic and compositional information for all‐inorganic CsPbIBr2 films on the nanoscale. It is found that under light and electron beam illumination, “iodide‐rich” CsPbI(1+x)Br(2?x) phases form at grain boundaries as well as segregate as clusters inside the film. Phase segregation generates a high density of mobile ions moving along grain boundaries as ion migration “highways.” Finally, these mobile ions can pile up at the perovskite/TiO2 interface resulting in formation of larger injection barriers, hampering electron extraction and leading to strong current density–voltage hysteresis in the polycrystalline perovskite solar cells. This explains why the planar CsPbIBr2 solar cells exhibit significant hysteresis in efficiency measurements, showing an efficiency of up to 8.02% in the reverse scan and a reduced efficiency of 4.02% in the forward scan, and giving a stabilized efficiency of 6.07%. 相似文献
Label‐free optical nano‐imaging of dendritic structures and intracellular granules in biological cells is demonstrated using a bright and homogeneous nanometric light source. The optical nanometric light source is excited using a focused electron beam. A zinc oxide (ZnO) luminescent thin film was fabricated by atomic layer deposition (ALD) to produce the nanoscale light source. The ZnO film formed by ALD emitted the bright, homogeneous light, unlike that deposited by another method. The dendritic structures of label‐free macrophage receptor with collagenous structure‐expressing CHO cells were clearly visualized below the diffraction limit. The inner fiber structure was observed with 120 nm spatial resolution. Because the bright homogeneous emission from the ZnO film suppresses the background noise, the signal‐to‐noise ratio (SNR) for the imaging results was greater than 10. The ALD method helps achieve an electron beam excitation assisted microscope with high spatial resolution and high SNR.
Halide perovskite solar cells have achieved a certified efficiency of 25.2%, surpassing CdTe and CuInGaSe2, which have long been regarded as the most‐efficient thin‐film photovoltaic materials. As this exciting class of materials continues to mature, researchers will require characterization techniques capable of exposing the interplay among structure, chemistry, and optoelectronic properties to inform processing strategies and increase both device efficiencies and long‐term stability. Cathodoluminescence microscopy is an ideal technique to provide such information due to the high spatial resolution and robust optical information acquired. Here, the current body of work related to cathodoluminescence analysis of halide perovskite materials for optoelectronic applications is surveyed. This review demonstrates how cathodoluminescence can monitor degradation due to environmental stressors, phase segregation resulting from material processing, and other halide perovskite‐centric material issues. A persistent concern associated with e‐beam‐based analysis of halide perovskites is what effect the electron beam has on the material properties being probed. Addressing this, a detailed discussion is provided on the origin of the cathodoluminescence signal and a review of studies focused on revealing changes in the properties of halide perovskites resulting from e‐beam excitation. Finally, a perspective on future opportunities to expand the role of cathodoluminescence analysis for halide perovskites is provided. 相似文献