Inheritance of resistance to leaf and glume blotch caused by Septoria nodorum Berk. in winter wheat

Sixteen crosses between eight winter wheat cultivars were screened for resistance to Septoria nodorum leaf and glume blotch in the F₁ and F₄ generations using artificial inoculation in the field. The F₁ of most crosses showed dominance for susceptibility on both ear and leaf. The effects of general combining ability were of similar magnitude as the effects for specific combining ability. On the basis of the phenotypic difference of the parents, no prediction was possible about the amount and the direction of genetic variance in the segregating populations. The variation observed in this study both within and among the segregating populations suggests a quantitative inheritance pattern influencing the expression of the two traits. The components of variance between F₂ families within a population were as high as (for S. nodorum blotch on the ear) or higher (for S. nodorum blotch on the leaf) than those between populations. Therefore, strong selection within a few populations may be as effective to obtain new resistant genotypes as selection in a large number of populations. In almost all crosses, progenies were found that were more resistant than the better parent. Thus transgression breeding may be a tool to breed for higher levels of resistance to S. nodorum blotch. Highly resistant genotypes were found even in combination with two susceptible parents. The genetic source for Septoria resistance is probably broader than is generally assumed and could be used to improve S. nodorum resistance by combination breeding followed by strong selection in large populations. Received: 18 January / Accepted: 30 April 1999     

Identification of molecular markers for resistance to Septoria nodorum blotch in durum wheat

The development of Septoria nodorum blotch-resistant cultivars has become a high priority objective for durum wheat breeding programs. Marker-assisted selection enables breeders to improve selection efficiency. In order to develop markers for resistance to Septoria nodorum blotch, a set of F₅ recombinant inbred lines, derived from the crosses Sceptre/3–6, Sceptre/S9–10 and Sceptre/S12–1, was developed based on the F₂-derived family method. Two RAPD markers, designated UBC521₆₅₀ and RC37₅₁₀, were detected by bulked segregant analysis and located approximately 15 and 13.1 centiMorgans (cM) from the resistance gene snbTM, respectively. A SCAR marker was also successfully developed for marker-assisted selection in breeding programs based on the sequence of the RAPD marker UBC521₆₅₀. This is the first report of DNA-based markers linked to resistance for Septoria nodorum blotch in durum wheat. Received: 8 March 2000 / Accepted: 25 June 2000     

Molecular cytogenetic characterization of four partial wheat-Thinopyrum ponticum amphiploids and their reactions to Fusarium head blight, tan spot, and Stagonospora nodorum blotch

Four wheat (Triticum aestivum L.)-Thinopyrum ponticum derivatives SS5 (PI604926), SS156 (PI604947), SS363 (PI604970), and SS660 (PI604879), were identified as resistant to Fusarium head blight (FHB), a serious fungal disease of wheat worldwide. Seedling reactions to tan spot and Stagonospora nodorum blotch (SNB), two important foliar diseases of wheat, suggest that these four derivatives are resistant to tan spot and two of them (SS5 and SS156) are resistant to SNB. Fluorescent genomic in situ hybridization (FGISH) patterns of mitotic chromosomes indicate that these four derivatives are partial wheat-Th. ponticum amphiploids, each with a total of 56 chromosomes, though with different amounts of Th. ponticum chromatin. These four amphiploids were hybridized with each other to determine homology between the Th. ponticum genomes in each of the amphiploids. Analysis of chromosome pairing in the F₁ hybrids using FGISH suggests that each amphiploid carries a similar set of Th. ponticum chromosomes. These wheat-Th. ponticum amphiploids represent a potential novel source of resistance to FHB, tan spot, and SNB for wheat breeding.     

Microsatellite Markers Associated with Spot Blotch Resistance in Spring Wheat

Spot blotch, caused by Cochliobolus sativus, is a serious wheat (Triticum aestivum L.) disease in the warm areas of South Asia. Breeding for resistance in the past 15 years has produced limited progress, and newly developed wheat cultivars suffer considerable yield reductions under spot blotch epidemics in the region. Resistance is often controlled by multiple genes with additive effects. Marker‐assisted selection, in combination with field selection, could accelerate the identification of progeny with multiple genes for resistance early in the breeding process. A study was conducted to determine microsatellite markers associated with resistance in the F₇ progeny from a cross between the spot blotch‐susceptible Sonalika and resistant G162 wheat genotypes. A parental survey using 171 simple sequence repeats (SSR) primer sets and spread over 21 chromosomes of wheat identified 52% polymorphic loci. However, only 15 polymorphic markers showed association with two bulks, one each of progeny with low and with high spot blotch severity. The detailed analysis indicated that progeny lines with low spot blotch severity could be separated from those with high severity using three SSR markers located on three wheat chromosomes. The findings may be useful in developing a marker‐assisted selection strategy for spot blotch resistance in wheat.     

Detection of QTLs for Stagonospora glume blotch resistance in Swiss winter wheat

Stagonospora nodorum is the causal agent of the Stagonospora glume blotch disease in hexaploid wheat. The Swiss winter bread wheat cv. 'Arina' has a highly effective, durable and quantitative glume blotch resistance. We studied 240 single seed descent (SSD)-derived lines of an 'Arina × Forno' F_5:7 population to identify and map quantitative trait loci (QTLs) for glume blotch resistance under natural infestation. Using composite interval mapping (CIM) and LOD>4.5, we detected two chromosomal regions on chromosome arms 3BS and 4BL which were specifically associated with glume blotch resistance. These identified QTLs were designated QSng.sfr-3BS and QSng.sfr-4BL, respectively. QSng.sfr-3BS peaked at the locus Xgwm389 in the telomeric region of the short arm of chromosome 3B and explained 31.2% of the observed phenotypic variance for the resistance within the population. The responsible QSng.sfr-3BS allele originated from the resistant parent 'Arina'. The QTL QSng.sfr-4BL (19.1%) mapped to chromosome arm 4BL ('Forno' allele) very close to two known genes, TaMlo and a catalase (Cat). Both QTL alleles combined could enhance the resistance level by about 50%. Additionally, they showed significant epistatic effects (4.4%). We found PCR-based microsatellite markers closely linked to QSng.sfr-3BS (gwm389) and QSng.sfr-4BL (gwm251) which make marker-assisted selection (MAS) for Stagonospora glume blotch resistance feasible. We also found one resistance QTL, QSng.sfr-5BL, on the long arm of chromosome 5B which overlapped with QTLs for plant height as well as heading time.Communicated by H. C. Becker     

A field screening method to evaluate rice breeding lines for resistance to the hoja blanca virus

A method is presented for rearing large colonies of viruliferous Sogatodes oryzicola, vector of the rice hoja blanca virus (RHBV). These colonies were used for field screening up to 10 000 rice breeding lines per season for resistance to RHBV. Uniform infection of check varieties in the field indicated that the method was adequate. Field release of vectors when plants were 14 days old resulted in satisfactory disease incidence, after 21 days, to distinguish lines segregating for resistance from lines uniformly resistant or susceptible. Various sources of resistance identified earlier continued to be resistant under the screening conditions. Progeny of lines identified as non-segregating resistant continued as non-segregating resistant. Resistant plants from lines segregating for resistance produced progeny lines that were segregating and non-segregating. Ratios of resistant to susceptible plants in F₁ progeny of three-way crosses were consistent with earlier observations that RHBV resistance is a dominant character. The susceptibility of the commercial checks indicates that rice production in RHBV areas of tropical Latin America continues to be at risk from the virus. Virus-resistant commercial cultivars resulting from this method should be available in 2 years.     

Variation in Aggressiveness of Stagonospora nodorum Isolates in North Dakota

Stagonospora nodorum blotch (SNB), caused by Stagonospora nodorum, is an important disease in the northern Great Plains of the United States and in other wheat‐producing regions in the world. SNB can be managed by different strategies including the use of resistant cultivars. Genetic variation in the pathogen populations is one of the important factors in the development of durable resistant cultivars. Our main objective was to determine variation in aggressiveness/virulence in the 40 isolates of S. nodorum collected from various locations in North Dakota. To achieve this goal, we tested the isolates on two susceptible wheat cultivars (cvs ‘ND495’ and ‘Alsen’) and two resistant wheat cultivars (cvs ‘Erik’ and ‘Salamouni’) – two‐leaf‐stage seedlings under controlled conditions. Aggressiveness of each isolate was characterized by the two epidemiological parameters: percent necrotic leaf area (% NLA) and lesion type (LT) 8 days post‐inoculation. The isolates differed significantly (P ≤ 0.05) for % NLA and LT, and were grouped into three aggressiveness groups (AG): low, medium and highly aggressive. Four isolates (S50, S57, S66 and S89) induced 18–26% NLA and were included into the low aggressive group (AG 1). Three isolates (S15, S39 and S89) induced 57–59% NLA and were considered highly aggressive (AG 3). Thirty‐three isolates were medium aggressive (AG 2). No relationship between AG and mating types was observed. There were significant (P ≤ 0.05) differences in % NLA and LT among wheat cultivars. Significant wheat cultivars by isolates interaction was also demonstrated, suggesting evidence for the existence of host specificity in this system. Overall, our results indicate that S. nodorum isolates prevalent in North Dakota varied greatly in their aggressiveness and that AG 3 isolates can be utilized in breeding wheat for resistance to SNB.     

Sources and donors of resistance to wheat spot blotch caused by Bipolaris sorokiniana Shoem. (Cochliobolus sativus Drechs. ex Dastur)

The resistance of wheat lines and cultivars from the Institute of Crop Breeding (Harbin, China) and synthetic, hexaploid wheat lines derived from T. durum and T. tauschii (CIMMYT) were screened for resistance to spot blotch Bipolaris sorokiniana Shoem. using field and laboratory tests. The highly and moderately resistant wheat samples were determined. The satisfactory coincidence of data obtained from evaluation of type reaction of seedlings and disease severity in adult plant stage was demonstrated. The genetics of resistance in Chinese lines Long 98-4554, Long 98-4546, Long mai 24, Long mai 23 and Canadian line 181-5 was studied using hybridological analysis. The resistance in these lines was inherited as quantitative traits and was conditioned by a few (one or two) genes. The absence of susceptible plants in F₂ in crosses of resistant lines Long 98-4554, Long 98-4546, Long mai 24 and 181-5 can testify to the presence of a common gene of resistance. Our data reveals the poor genetic diversity for spot blotch resistance in studying wheat genotypes.     

Application of PCR based diagnostics in the exploration of Parastagonospora nodorum prevalence in wheat growing regions of Himachal Pradesh

Stagonospora leaf and glume blotch (SLGB) of wheat caused by Parastagonospora nodorum (formerly Stagonospora nodorum) has recently emerged as a major problem in changing climatic conditions of Himachal Pradesh (HP), especially during delayed winter rains. In the present studies symptomatology, morpho-cultural as well as molecular marker based identification showed the prevalence of disease in the state and conclusively proved that leaf and glume blotch of wheat is caused by P. nodorum. The test pathogen showed 100% homology with other reported P. nodorum isolates by rDNA (ribosomal DNA) analysis. In addition, the amplification of rDNA region of 36 P. nodorum isolates representing various agro-ecological areas of HP and one infected wheat leaf sample generated an amplicon of ~ 449-bp with JB433 (5′-ACACTCAGTAGTTTACTACT-3′) and JB434 (5′-TGTGCTGCGCTTCAATA-3′) P. nodorum specific primer pair whereas no amplification was observed with the genomic DNA of Septoria titici, Stemphylium vesicarium and healthy wheat leaf sample. This study on integration of morpho-cultural and microscopic methods along with PCR based technique could form basis for routine diagnosis of the SLGB in wheat samples during early growth stages of crop in the seed production fields.

     

Quantitative trait loci for resistance to spot blotch caused by Bipolarissorokiniana in wheat (T.aestivum L.) lines ‘Ning 8201’ and ‘Chirya 3’

Spot blotch caused by Bipolaris sorokiniana is a destructive disease of wheat in warm and humid wheat growing regions of the world. To identify quantitative trait loci (QTLs) for spot blotch resistance, two mapping populations were developed by making the crosses between common susceptible cultivar ‘Sonalika’ with the resistant breeding lines ‘Ning 8201’ and ‘Chirya 3’. Single seed descent derived F₆, F₇, F₈ lines of the first cross ‘Ning 8201’ × ‘Sonalika’ were evaluated for resistance to spot blotch in three blocks in each of the 3 years. After screening of 388 pairs of simple sequence repeat primers between the two parents, 119 polymorphic markers were used to genotype the mapping population. Four QTLs were identified on the chromosomes 2AS, 2BS, 5BL and 7DS and explained 62.9% of phenotypic variation in a simultaneous fit. The QTL on chromosome 2A was detected only in 1 year and explained 22.7% of phenotypic variation. In the second cross (‘Chirya 3’ × ‘Sonalika’), F₇ and F₈ population were evaluated in three blocks in each of the 2 years. In this population, five QTLs were identified on chromosomes 2BS, 2DS, 3BS, 7BS and 7DS. The QTLs identified in the ‘Chirya 3’ × ‘Sonalika’ population explained 43.4% of phenotypic variation in a simultaneous fit. The alleles for reduced disease severity in both the populations were derived from the respective resistant parent. The QTLs QSb.bhu-2B and QSb.bhu-7D from both populations were placed in the same deletion bins, 2BS1-0.53-0.75 and 7DS5-0.36-0.61, respectively. The closely linked markers Xgwm148 to the QTL on chromosome 2B and Xgwm111 to the QTL on chromosome 7D are potentially diagnostic markers for spot blotch resistance.     

Phenotyping at hot spots and tagging of QTLs conferring spot blotch resistance in bread wheat

Spot blotch is a major foliar disease of wheat caused by Bipolaris sorokiniana in warm and humid environments of the world including South Asian countries. In India, it has a larger impact in Indo-Gangetic plains of the country. Therefore, the present study was undertaken to phenotype a mapping population at different hot spots of India and to detect quantitative trait loci (QTL) for resistance to spot blotch in wheat. For this study, 209 single seed descent (SSD) derived F₈, F₉, F₁₀ recombinant inbred lines (RILs) of the cross ‘Sonalika’ (an Indian susceptible cultivar)/‘BH 1146’ (a Brazilian resistant cultivar) were assessed for spot blotch resistance at two hot spot locations (Coochbehar and Kalyani) for three years and for two years under controlled conditions in the polyhouse (Karnal). The population showed large variation in spot blotch reaction for disease severity in all the environments indicating polygenic nature of the disease. Microsatellite markers were used to create the linkage maps. Joint and/or individual year analysis by composite interval mapping (CIM) and likelihood of odds ratio (LOD) >2.1, detected two consistent QTLs mapped on chromosome 7BL and 7DL and these explained phenotypic variation of 11.4 percent and 9.5 percent over the years and locations, respectively. The resistance at these loci was contributed by the parent ‘BH 1146’ and shown to be independent of plant height and earliness. Besides, association of some agro-morphological traits has also been observed with percent disease severity. These identified genomic regions may be used in future wheat breeding programs through marker assisted selection for developing spot blotch resistant cultivars.     

Strains of <Emphasis Type="Italic">Bacillus</Emphasis> ssp. regulate wheat resistance to <Emphasis Type="Italic">Septoria nodorum</Emphasis> Berk.

The ability of Bacillus subtilis Cohn and Bacillus thuringiensis Berliner to induce systemic resistance in wheat plants to the casual agent of Septoria nodorum Berk., blotch has been studied. It has been shown that strains of Bacillus ssp. that possess the capacity for endophytic survival have antagonistic activity against this pathogen in vitro. A reduction of the degree of Septoria nodorum blotch development on wheat leaves under the influence of Bacillus spp. was accompanied by the suppression of catalase activity, an increase in peroxidase activity and H₂O₂ content, and expression of defence related genes such us PR-1, PR-6, and PR-9. It has been shown that B. subtilis 26 D induces expression levels of wheat pathogenesis-related (PR) genes which marks a SA-dependent pathway of sustainable development and that B. thuringiensis V-5689 and V-6066 induces a JA/ET-dependent pathway. These results suggest that these strain Bacillus spp. promotes the formation of wheat plant resistance to S. nodorum through systemic activation of the plant defense system. The designed bacterial consortium formed a complex biological response in wheat plants infected phytopathogen.     

Identification of RAPD markers linked to the gene PM 1 for resistance to powdery mildew in wheat

 Powdery mildew caused by Blumeria graminis DC. f. sp. triticiém. Marchal is an important disease of wheat (Triticum aestivum L. em Thell). We report here the identification of three random amplified polymorphic DNA (RAPD) markers closely linked to a gene for resistance to B. graminis in wheat. RAPD-PCR (polymerase chain reaction) analysis was conducted using bulked segregant analysis of closely related lines developed from a segregating F₅ family. The F₅ family was derived from a cross between the susceptible cultivar Clark and the resistant line Zhengzhou 871124. Genetic analysis indicated that resistance of Zhengzhou 871124 to powdery mildew is conferred by the gene Pm1. After performing RAPD-PCR analysis with 1300 arbitrary 10-mer primers and agarose-gel electrophoresis, two RAPD markers, UBC320₄₂₀ and UBC638₅₅₀, were identified to be co-segregating with the disease resistance. No recombinants were observed between either of the RAPD markers and the gene for resistance to powdery mildew after analysis of 244 F₂ plants. The third RAPD marker, OPF12₆₅₀, was identified with denaturing gradient-gel electrophoresis (DGGE), and was determined to be 5.4±1.9 cM from the resistance gene. UBC320₄₂₀ and UBC638₅₅₀ were present in wheat powdery mildew differential lines carrying the gene Pm1, suggesting linkage between these markers and the Pm1 resistance gene. Co-segregation between Pm1 and the two markers UBC320₄₂₀ and UBC638₅₅₀ was confirmed in a segregating population derived from a cross with CI14114, the wheat differential line carrying Pm1. The method of deriving closely related lines from inbred families that are segregating for a trait of interest should find wide application in the identification of DNA markers linked to important plant genes. The RAPD marker UBC638₅₅₀ was converted to a sequence tagged site (STS). RAPD markers tightly linked to target genes may facilitate selection and enable gene pyramiding for powdery mildew resistance in wheat breeding programs. Received: 10 December 1995 / Accepted: 13 September 1996     

Mapping of resistance to spot blotch disease caused by Bipolaris sorokiniana in spring wheat

Spot blotch caused by Bipolaris sorokiniana is a destructive disease of wheat in warm and humid wheat growing regions of the world. The development of disease resistant cultivars is considered as the most effective control strategy for spot blotch. An intervarietal mapping population in the form of recombinant inbred lines (RILs) was developed from a cross ‘Yangmai 6’ (a Chinese source of resistance) × ‘Sonalika’ (a spot blotch susceptible cultivar). The 139 single seed descent (SSD) derived F₆, F₇, F₈ lines of ‘Yangmai 6’ × ‘Sonalika’ were evaluated for resistance to spot blotch in three blocks in each of the 3 years. Joint and/or single year analysis by composite interval mapping (CIM) and likelihood of odd ratio (LOD) >2.2, identified four quantitative trait loci (QTL) on the chromosomes 2AL, 2BS, 5BL and 6DL. These QTLs were designated as QSb.bhu-2A, QSb.bhu-2B, QSb.bhu-5B and QSb.bhu-6D, respectively. A total of 63.10% of phenotypic variation was explained by these QTLs based on the mean over years. Two QTLs on chromosomes 2B and 5B with major effects were consistent over 3 years. All QTL alleles for resistance were derived from the resistant parent ‘Yangmai 6’.     

Association mapping of<Emphasis Type="Italic"> Stagonospora nodorum</Emphasis> blotch resistance in modern European winter wheat varieties

Association mapping in populations relevant for wheat breeding has a large potential for validating and fine-mapping QTLs identified in F2- or DH (double haploid)-derived populations. In this study, associations between markers in the region of QSng.sfr-3BS, a major QTL for resistance to Stagonospora nodorum glume blotch (SNG), and SNG resistance were investigated by linkage and association analyses. After increasing marker density in 240 F_5:7 recombinant inbred lines (RILs), QSng.sfr-3BS explained 43% of the genetic variance and peaked 0.6 cM proximal from the marker SUN2-3B. Association between SNG resistance and markers mapped in the region of QSng.sfr-3BS was investigated in a population of 44 modern European winter wheat varieties. Two genetically distinct subpopulations were identified within these lines. In agreement with linkage analyses, association mapping by a least squares general linear model (GLM) at marker loci in the region of QSng.sfr-3BS revealed the highest association with SNG resistance for SUN2-3B (p < 0.05). Association mapping can provide an effective mean of relating genotypes to complex quantitative phenotypes in hexaploid wheat. Linkage disequilibrium (r ²) in chromosome 3B extended less than 0.5 cM in 44 varieties, while it extended about 30 cM in 240 RILs, based on 91 SSR and STS marker-pair comparisons. This indicated that the association mapping population had a marker resolution potential at least 390-fold higher compared to the RIL population. Electronic supplementary material The online version of this article (doi:) contains supplementary material, which is available to authorized users.     

Mapping quantitative trait loci (QTLs) for resistance to Cercospora leaf spot disease (Cercospora beticola Sacc.) in sugar beet (Beta vulgaris L.)

The breeding of sugar beet varieties that combine resistance to Cercospora and high yield under non-diseased conditions is a major challenge to the breeder. The understanding of the quantitative trait loci (QTLs) contributing to Cercospora resistance offers one route to solving this problem. A QTL analysis of Cercospora resistance in sugar beet was carried out using a linkage map based on AFLP and RFLP markers. Two different screening methods for Cercospora resistance (a field test at Copparo, Italy, under natural infection, and a newly-developed leaf disc test) were used to estimate the level of Cercospora resistance; the correlation between scores from the field (at 162 days after sowing) and the leaf disc test was significant. QTL analysis was based on F₂ and F₃ (half-sib family) generations derived from crosses between diploid single plants of 93164P (resistant to Cercospora leaf spot disease) and 95098P (susceptible). Four QTLs associated with Cercospora resistance (based on Lsmean data of the leaf disc test) on chromosomes III, IV, VII and IX were revealed using Composite interval mapping. To produce populations segregating for leaf spot resistance as a single Mendelian factor, we selected for plants heterozygous for only one of the QTLs (on chromosome IV or IX) but homozygous for the others. Received: 1 September 1999 / Accepted 7 October 1999     

Genetics and mapping of adult plant rust resistance in soybean PI 587886 and PI 587880A

Two soybean accessions, PI 587886 and PI 587880A, previously identified as having resistance to Phakospora pachyrhizi Syd. (soybean rust, SBR) were used to create two populations (POP-1 and POP-2) segregating for SBR resistance. F₂-derived F₃ (F_2:3) families from each population were grown in a naturally SBR-infected field in Paraguay to determine inheritance and map resistance genes. Over 6,000 plants from 178 families in POP-1 and over 5,000 plants from 160 families in POP-2 were evaluated at R5 for lesion type: immune reaction (IR), reddish-brown (RB), or tan (TAN) colored lesions. Based on the lesion type present, each F_2:3 family was rated as resistant, segregating or susceptible and this classification was used to infer the F₂-phenotype and genotype. For both populations, the F₂ segregation ratios fit a 1:2:1 (resistant:segregating:susceptible) ratio expected for a single gene (P > 0.05). The RB lesions occurred almost exclusively in the heterozygous class, indicating incomplete dominance under the conditions of this study. Molecular markers flanking the locations of the known resistance genes were used to map the resistance gene in both populations to the Rpp1 locus. However, evaluation of PI 587886 and PI 587880A against eight P. pachyrhizi isolates indicated that the resistance allele in these two accessions was different from Rpp1. This test also demonstrated that these accessions were resistant to at least one P. pachyrhizi isolate collected in the southern US. This is the first report of using an adult plant field-screen with natural rust pressure to map SBR resistance.     

Genetic and physical characterization of theLR1 leaf rust resistance locus in wheat (Triticum aestivum L.)

The objective of this study was to characterize the leaf rust resistance locusLr1 in wheat. Restriction fragment length polymorphism (RELP) analysis was performed on the resistant lineLr1/6^*Thatcher and the susceptible varieties Thatcher and Frisal, as well as on the segregating F₂ populations. Seventeen out of 37 RFLP probes mapping to group 5 chromosomes showed polymorphism betweenLr1/6^*Thatcher and Frisal, whereas 11 probes were polymorphic between the near-isogenic lines (NILs)Lr1/6^*Thatcher and Thatcher. Three of these probes were linked to the resistance gene in the segregating F₂ populations. One probe (pTAG621) showed very tight linkage toLr1 and mapped to a single-copy region on chromosome 5D. The map location of pTAG621 at the end of the long arm of chromosome 5D was confirmed by the absence of the band in the nulli-tetrasomic line N5DT5B of Chinese Spring and a set of deletion lines of Chinese Spring lacking the distal part of 5DL. Twenty-seven breeding lines containing theLr1 resistance gene in different genetic backgrounds showed the same band asLr1/6^*Thatcher when hybridized with pTAG621. The RFLP marker was converted to a sequence-tagged-site marker using polymerase chain reaction (PCR) amplification. Sequencing of the specific fragment amplified from both NILs revealed point mutations as well as small insertion/deletion events. These were used to design primers that allowed amplification of a specific product only from the resistant lineLr1/6^*Thatcher. This STS, specific for theLr1 resistance gene, will allow efficient selection for the disease resistance gene in wheat breeding programmes. In addition, the identification of a D-genome-specific probe tightly linked toLr1 should ultimately provide the basis for positional cloning of the gene.     

Identification and molecular mapping of a resistance gene to powdery mildew from the synthetic wheat line M53

Powdery mildew disease caused by Blumeria graminis f. sp. tritici (Bgt) is an economically important disease in wheat worldwide. The identification of germplasms resistant to the disease can not only facilitate the breeding of resistant cultivars, but can also broaden the diversity of resistance genes. The Mexican M53 is a synthetic hexaploid wheat line developed at the International Maize and Wheat Improvement Center (CIMMYT) from the cross between Triticum durum and Aegilops tauschii249. Infection of M53 with 15 different pathogen races revealed that the resistance in M53 was race-dependent and effective against the majority of the tested Bgt races, including the race 15 predominant in the Beijing wheat growing area. Inoculation of the parents of M53 with the race 15 demonstrated that M53 and Ae. tauschii249 were resistant, whereas T. durum was susceptible. The inoculation of three segregating F₂ populations developed from the crosses between M53 and three susceptible Chinese wheat cultivars with the race 15 showed that the resistant gene in M53 segregated in a single dominant manner. Amplified fragment length polymorphism (AFLP) and simple sequence repeat (SSR) markers were used to map the gene in a segregating F₂ population consisting of 213 lines developed from the cross Wan7107 × M53. Two closely linked AFLP markers, Apm109 and Apm161, were identified to flank the gene with genetic distances of 1.0 cM and 3.0 cM, respectively. The recognized gene was assigned to the long arm of chromosome 5D as determined by three linked SSR markers, Xwmc289b, Xgwm583, and Xgwm292, and by the physical mapping of Apm109 using Chinese Spring nullisomic–tetrasomic and ditelosomic stocks. The resistance gene identified in M53, temporarily designated as Pm-M53, could be used in local wheat-breeding programs to improve powdery mildew resistance.