Validation of molecular markers for covered smut resistance and marker-assisted introgression of loose and covered smut resistance into hulless barley

Inheritance of covered smut resistance was investigated in three hulless × hulled barley populations (CDC Candle/Q21861, CDC McGwire/Q21861, and CDC McGwire/TR640). Greenhouse and/or field screening indicated resistance was controlled by a single major gene from Q21861 and TR640. Three molecular markers (UhR 450, aHor 2 and OPO6₇₈₀) linked to the covered smut resistance gene (Ruhq) in the hulled line Q21861 were assessed for their usefulness in selecting resistant hulless barley. All markers were linked to covered smut resistance in the three populations evaluated, although aHor 2 was only polymorphic in CDC Candle/Q21861. Two strategies, doubled haploidy (DH) and marker-assisted backcrossing (MAB), were used to simultaneously introgress Ruhq and loose smut resistance (Run8) into the hulless barley cultivar CDC McGwire. Thirty-five DH lines were developed from a cross of hulless loose smut resistant line SH00752 (CDC McGwire/TR251) by hulless covered smut resistant line SH01470 (CDC McGwire/Q21861). By screening the 35 DH lines for each of the markers, 14 were identified as positive for both. Following three rounds of screening by artificial inoculation, 12 of those were identified as resistant to both diseases. In the MAB program, “blind” selection based solely on markers was conducted through the BC₃F₂ generation; lines resistant to both diseases were obtained. One line, designated HB390, is being advanced to 2nd year of the Western Canadian Hulless Barley Co-operative yield trials, the final step to release of a cultivar for commercial production in Canada. These results confirm that molecular markers can be used in either DH or MAB programs to assist in the rapid introgression of simply inherited disease resistance genes into elite lines, with considerable time and cost savings.     

The use of bulk segregant analysis to identify a RAPD marker linked to leaf rust resistance in barley

An F₂ population from a cross between barley accession Q21861 and the Australian barley variety Galleon was used to develop RAPD markers for resistance to barley leaf rust (Puccinia hordei). Resistant and susceptible DNA bulks were constructed following the classification of F₂ plants by leaf rust infection type. Bulked segregant analysis was then used to identify a 2.7-kb marker, designated OU02₂₇₀₀ and located approximately 12cM from RphQ, a leaf rust resistance gene in Q21861. The marker was generated by PCR with the oligonucleotide primer OPU-02 (Operon). Infection types of F₃ progeny were used to confirm assignment of F₂ genotypes. OU02₂₇₀₀ was shown, retrospectively, to be useful in the identification of individual F₂ plants that had been originally misclassified as having susceptible infection types. Both the RAPD marker and RphQ will be potentially useful in the development of new barley cultivars.     

Identification and mapping of a leaf rust resistance gene in barley line Q21861.

Barley line Q21861 possesses an incompletely dominant gene (RphQ) for resistance to leaf rust caused by Puccinia hordei. To investigate the allelic and linkage relations between RphQ and other known Rph genes, F2 populations from crosses between Q21861 and donors of Rph1 to Rph14 (except for Rph8) were evaluated for leaf rust reaction at the seedling stage. Results indicate that RphQ is either allelic with or closely linked to the Rph2 locus. A doubled haploid population derived from a cross between Q21861 and SM89010 (a leaf rust susceptible line) was used for molecular mapping of the resistance locus. Bulked segregant analysis was used to identify markers linked to RphQ, using random amplified polymorphic DNAs (RAPDs), restriction fragment length polymorphisms (RFLPs), and sequence tagged sites (STSs). Of 600 decamer primers screened, amplified fragments generated by 9 primers were found to be linked to the RphQ locus; however, only 4 of them were within 10 cM of the target. The RphQ locus was mapped to the centromeric region of chromosome 7, with a linkage distance of 3.5 cM from the RFLP marker CDO749. Rrn2, an RFLP clone from the ribosomal RNA intergenic spacer region, was found to be very closely linked with RphQ, based on bulked segregant analysis. An STS marker, ITS1, derived from Rrn2, was also closely linked (1.6 cM) to RphQ.     

DNA markers linked to a T10 loose smut resistance gene in wheat (Triticum aestivum L.).

Screening for loose smut resistance in wheat is difficult. Selecting lines with DNA markers linked to loose smut resistance would be more reliable and less costly. Molecular markers linked to a race T10 loose smut resistance gene were identified using a F6 single seed descent segregating population. A RAPD marker and a RFLP marker were located on opposite flanks of the resistance gene and were shown to be loosely linked. The RAPD marker was converted to a user friendly polymorphic SCAR marker that represented a single genetically defined locus in hexaploid wheat. Using these two bracketing markers simultaneously, the error rate for T10 resistance selection due to crossing-over was reduced to 4%. These markers can be used for a faster and more reliable selection of T10 resistant plants than previous conventional loose smut ratings.     

Development of markers linked to Diuraphisnoxia resistance in wheat using a novel PCR-RFLP approach

Through random amplified polymorphic DNA (RAPD) analysis we identified a putative marker linked to the Dn5 resistance gene. This marker was converted to a more reliable sequence-characterised-amplified regions (SCAR) marker. The initial SCAR marker amplified the correct amplification product but failed to discern between the susceptible and resistant individuals. Hence, it was utilised to sequence the internal fragment. All nested primers designed from the internal sequences were also unable to produce any polymorphism between the susceptible and resistant cultivars. Restriction digests were then performed on these fragments, and the restriction enzyme EcoRI was able to discern between the susceptible and resistant F₂ individuals of the Dn5 population. This granted one marker amplified with the internal SCAR primer set OPF14₁₀₈₃ the ability to differentiate between parental individuals carrying the Dn5 genes. This marker was tested in a segregating F₂ population carrying the Dn5 resistance gene and proved able to differentiate between the segregating individuals. This marker may prove useful in marker assisted selection (MAS), although performing restriction digests may hamper the throughput of a high number of samples. Received: 4 August 1999 / Accepted: 27 August 1999     

RAPD-based SCAR marker SCA 12 linked to recessive gene conferring resistance to anthracnose in sorghum [Sorghum bicolor (L.) Moench]

Anthracnose, caused by Colletotrichum graminicola, infects all aerial parts of sorghum, Sorghum bicolor (L.) Moench, plants and causes loss of as much as 70%. F₁ and F₂ plants inoculated with local isolates of C. graminicola indicated that resistance to anthracnose in sorghum accession G 73 segregated as a recessive trait in a cross with susceptible cultivar HC 136. To facilitate the use of marker-assisted selection in sorghum breeding programs, a PCR-based specific sequence characterized amplified region (SCAR) marker was developed. A total of 29 resistant and 20 susceptible recombinant inbred lines (RILs) derived from a HC 136 × G 73 cross was used for bulked segregant analysis to identify a RAPD marker closely linked to a gene for resistance to anthracnose. The polymorphism between the parents HC 136 and G 73 was evaluated using 84 random sequence decamer primers. Among these, only 24 primers generated polymorphism. On bulked segregant analysis, primer OPA 12 amplified a unique band of 383 bp only in the resistant parent G 73 and resistant bulk. Segregation analysis of individual RILs showed the marker OPA 12₃₈₃ was 6.03 cM from the locus governing resistance to anthracnose. The marker OPA 12₃₈₃ was cloned and sequenced. Based on the sequence of cloned RAPD product, a pair of SCAR markers SCA 12-1 and SCA 12-2 was designed using the MacVector program, which specifically amplified this RAPD fragment in resistant parent G 73, resistant bulk and respective RILs. Therefore, it was confirmed that SCAR marker SCA 12 is at the same locus as RAPD marker OPA 12₃₈₃ and hence, is linked to the gene for resistance to anthracnose.     

Characterization and fine mapping of <Emphasis Type="Italic">RppQ</Emphasis>, a resistance gene to southern corn rust in maize

Southern corn rust (SCR) is a fungal disease caused by Puccinia polysora Underw, which can infect maize and may result in substantial yield losses in maize production. The maize inbred line Qi319 carries the SCR resistance gene RppQ. In order to identify molecular markers linked to the RppQ gene, several techniques were utilized including random amplified polymorphic DNA (RAPD), simple sequence repeat (SSR), and amplified fragment length polymorphism (AFLP). In addition, sequence characterized amplified region (SCAR) techniques combined with bulked segregant analysis (BSA) were used. Seven RAPD markers, eight SSR markers, and sixty-three AFLP primer combinations amplified polymorphisms between two parents and two bulk populations. A large F₂ population was used for genetic analysis and for fine mapping of the RppQ gene region. One AFLP polymorphic band, M-CAA/E-AGC₃₂₄, was converted to a SCAR marker, MA7, which was mapped to a position 0.46 cM from RppQ. Finally, the RppQ gene was mapped between the SCAR marker MA7 and the AFLP marker M-CCG/E-AGA₁₅₇ with distances of 0.46 and 1.71 cM, respectively.     

葡萄感霜霉病基因的分子标记(英文)

 在葡萄抗病育种中 ,幼苗期排除感霜霉病的后代具有特别重要的意义 .用 BSA,RAPD和SCAR方法研究了葡萄感霜霉病基因的分子标记 .分析了两个种间杂交组合 [毛葡萄 (抗病 )×欧洲葡萄 (感病 ) ]88- 1 1 0和 88- 84与 88- 1 1 0的 F1代自交或互交所得的 3个 F2 代 ,以及欧洲葡萄品种和中国野生葡萄种 .共筛选了 2 80个随机引物 .引物 OPO1 0产生了一个 RAPD标记 OPO1 0 - 80 0与葡萄感霜霉病主效基因紧密联锁 .将该 DNA片段克隆并测序 .OPO1 0 - 80 0的实际长度为 835bp,所以 OPO1 0 - 80 0应为 OPO1 0 - 835.据其两端序列 ,设计了一对长度为 2 6bp和 2 8bp的特异引物分别扩增上述试材 ,获得了与该 RAPD标记相同大小的一条带 ,将 RAPD标记转化为 SCAR标记SCO1 0 - 835.并证实了此 SCAR标记的通用性 ,该 SCAR标记可用于葡萄抗病育种中杂种后代对霜霉病的抗病与感病性鉴定 .     

Development of SCAR marker linked to anthracnose resistance from Indian French bean (Phaseolus vulgaris L.) germplasm

This study was performed to identify the French bean genotypes resistant to anthracnose disease. Thirty-five RAPD primers were used for screening four resistant and nine susceptible French bean accessions. Of these, three RAPD primers, viz. OPAH16₇₀₀, OPN6₇₀₀ and OPS₉₀₀ showed polymorphic bands differentiating between resistant and susceptible genotypes. The RAPD primer OPAH16 was then selected for conversion into a SCAR marker. The polymorphic band present in the resistant line (D line) was eluted, cloned in pTZ57R/T cloning vector and was then transferred into DH5α Escherichia coli cells. The positively transformed clones were selected based on ampicillin resistance blue-white colony selection method. The plasmid DNA was isolated from transformed white colonies, sequenced and developed into SCAR marker SPAH 16. This SCAR marker SPAH 16 was then verified via PCR using the original French bean accessions.     

An RGA-Derived SCAR Marker Linked to PLRV Resistance from Solanum tuberosum ssp. andigena

A resistance gene analog (RGA)-derived sequence-characterized amplified region (SCAR) marker was successfully developed based on sequence homology with disease resistance genes of an AFLP molecular marker tightly linked to the Rl _adg gene of Solanum tuberosum ssp. andigena. The new marker was designated as ‘RGASC850’ (RGA-derived SCAR) based on the size of the amplified fragment. ‘RGASC850’ could be efficiently used for monitoring introgression of Rl _adg against backgrounds of improved gene pools with low likelihood of identifying false positives due to recombination. This SCAR proved to be highly predictive of Rl _adg -based resistance, as it did not amplify potato leafroll virus (PLRV) resistance sources other than andigena, and thus would be useful in developing cultivars with complementary sources of resistance to PLRV. In addition, a cleaved amplified polymorphic sequence (CAPS) marker based on ‘RGASC850’ was developed capable of distinguishing genotypes carrying Rl _adg . This CAPS marker would be useful for screening breeding populations derived from wide crosses, and confirming presence of the Rl _adg gene in those parents amplifying the ‘RGASC850’ marker.     

Identification and chromosomal location of major genes for resistance to Pyrenophora teres in a doubled-haploid barley population.

Net blotch, caused by Pyrenophora teres, is one of the most economically important diseases of barley worldwide. Here, we used a barley doubled-haploid population derived from the lines SM89010 and Q21861 to identify major quantitative trait loci (QTLs) associated with seedling resistance to P. teres f. teres (net-type net blotch (NTNB)) and P. teres f. maculata (spot-type net blotch (STNB)). A map consisting of simple sequence repeat (SSR) and amplified fragment length polymorphism (AFLP) markers was used to identify chromosome locations of resistance loci. Major QTLs for NTNB and STNB resistance were located on chromosomes 6H and 4H, respectively. The 6H locus (NTNB) accounted for as much as 89% of the disease variation, whereas the 4H locus (STNB resistance) accounted for 64%. The markers closely linked to the resistance gene loci will be useful for marker-assisted selection.     

Mapping of the loose smut resistance gene Ut6 in wheat (Triticum aestivum L.)

Loose smut of wheat (Triticum aestivum L.) caused by Ustilago tritici (Pers.) Rostr. can cause considerable yield losses in the absence of appropriate management practices. The use of wheat varieties with loose smut resistance is an efficient and effective control technique. However, the development of commercial wheat lines with resistance to loose smut is time- and labour-consuming. DNA markers linked to loose smut resistance gene(s) would assist the development of loose smut resistant genotypes. The genetics of loose smut resistance was studied in an F5‐derived recombinant inbred line (RIL) population of 94 lines from the cross BW278/AC Foremost. The line AC Foremost is resistant and line BW278 is susceptible to U. tritici race T10. Phenotypic assessment revealed that a single gene, designated Ut6, segregated for resistance to race T10 in the RIL population. A modified bulked segregant analysis identified a microsatellite marker linked to Ut6. A linkage map was developed consisting of linked microsatellite loci and the resistance gene. The loose smut resistance gene Ut6 mapped to the long arm of chromosome 5B. Five microsatellite markers mapped within 6.7 cM of Ut6. The microsatellite markers gpw5029 and barc232 flanked Ut6 at distances of 1.3 and 2.8 cM on the distal and proximal sides, respectively. A diverse set of wheat lines was haplotyped for Ut6 using the linked microsatellite markers gpw5029 and barc232. The haplotype analysis suggested that the microsatellite markers associated with Ut6 will be useful for marker-assisted selection of loose smut resistant wheat lines.     

Development of RAPD and SCAR markers linked to the Russian wheat aphid resistance gene Dn2 in wheat

 RAPD (random amplified polymorphic DNA) analysis was used to identify molecular markers linked to the Dn2 gene conferring resistance to the Russian wheat aphid (Diuraphis noxia Mordvilko). A set of near-isogenic lines (NILs) was screened with 300 RAPD primers for polymorphisms linked to the Dn2 gene. A total of 2700 RAPD loci were screened for linkage to the resistance locus. Four polymorphic RAPD fragments, two in coupling phase and two in repulsion phase, were identified as putative RAPD markers for the Dn2 gene. Segregation analysis of these markers in an F₂ population segregating for the resistance gene revealed that all four markers were closely linked to the Dn2 locus. Linkage distances ranged from 3.3 cM to 4.4 cM. Southern analysis of the RAPD products using the cloned RAPD markers as probes confirmed the homology of the RAPD amplification products. The coupling-phase marker OPB10_880c and the repulsion-phase marker OPN1_400r were converted to sequence characterized amplified region (SCAR) markers. SCAR analysis of the F₂ population and other resistant and susceptible South African wheat cultivars corroborated the observed linkage of the RAPD markers to the Dn2 resistance locus. These markers will be useful for marker-assisted selection of the Dn2 gene for resistance breeding and gene pyramiding. Received: 1 July 1997 / Accepted: 20 October 1997     

Identification of molecular markers for the detection of the yellow rust resistance gene Yr17 in wheat

The Yr17 gene, which is present in many European wheat cultivars, displays yellow rust resistance at the seedling stage. The gene introduced into chromosome 2A from Aegilops ventricosa was previously found to be closely linked (0.5 cM) to leaf and stem rust resistance genes Lr37 and Sr38, respectively. The objective of this study was to identify molecular markers linked to the Yr17 gene. We screened with RAPD primers, for polymorphism, the DNAs of cv. Thatcher and the leaf rust-resistant near-isogenic line (NIL) RL 6081 of cv. Thatcher carrying the Lr37 gene. Using a F2 progeny of the cross between VPM1 (resistant) and Thésée (susceptible), the RAPD marker OP-Y15580 was found to be closely linked to the Yr17 gene. We converted the OP- Y15580 RAPD marker into a sequence characterized amplified region (SCAR). This SCAR marker (SC-Y15) was linked at 0.8 ± 0.7 cM to the Yr17 resistance gene. We tested the SC-Y15 marker over a survey of 37 wheat cultivars in order to verify its consistency in different genetic backgrounds and to explain the resistance of some cultivars against yellow rust. Moreover, we showed that the Xpsr150-2Mv locus marker of Lr gene described by Bonhomme et al. [6] which possesses A. ventricosa introgression on the 2A chromosome was also closely linked to the Yr17 gene. Both the SCAR SC-Y15 and Xpsr150-2Mv markers should be used in breeding programmes in order to detect the cluster of the three genes Yr17, Lr37 and Sr38 in cross progenies. This revised version was published online in June 2006 with corrections to the Cover Date.     

Development of SCAR markers linked to the gene Or5 conferring resistance to broomrape (Orobanche cumana Wallr.) in sunflower

A consensus molecular linkage map of 61.9 cM containing the Or5 gene, which confers resistance to race E of broomrape orobanche cumana, five SCAR markers (three dominant, two codominant) and one RAPD marker were identified based on segregation data scored from two F₂ populations of susceptible×resistant sunflower line crosses. Bulked segregant analysis was carried out to generate the five SCAR markers, while the single RAPD marker in the group was identified from 61 segregating RAPD markers that were directly screened on one of the two F₂ populations. The five SCAR markers, RTS05, RTS28, RTS40, RTS29 and RTS41, were significantly (LOD≥4.0) linked to the Or5 gene and mapped separately at 5.6, 13.6, 14.1, 21.4 and 39.4 cM from the Or5 locus on one side, while the RAPD marker, UBC120_660, was found at 22.5 cM (LOD=1.4) on the opposite side. These markers should facilitate the efficient transfer of the resistance gene among sunflower breeding lines. As the first report on molecular markers linked to a broomrape resistance gene, the present work provides a starting point to study other genes and to examine the hypothesis of the clustering of broomrape resistance genes in sunflower. Received: 16 September 1998 / Accepted: 22 June 1999     

Targeted development of a microsatellite marker associated with a true loose smut resistance gene in barley (Hordeum vulgare L.)

Microsatellite markers have many of the properties of an ideal marker, but development of microsatellite markers is tedious, time-consuming and expensive. In the past few years, great efforts have been made to develop, map and utilize microsatellite markers in various crops. It is still a major challenge to find a microsatellite marker associated with an economically important trait. In the present study we report on the targeted development of a microsatellite marker to a barley disease resistance gene. The method includes the following steps: (1) pooling DNA samples from a segregating population based on the principle of bulked-segregant analysis; (2) digesting the pooled DNAs and ligating adaptors; (3) selectively amplifying and identifying polymorphic microsatellites; and (4) developing primers for the microsatellite associated with the targeted trait. Using this method, a microsatellite marker associated with the true loose smut resistance gene (Un8) in the Harrington × TR306 doubled-haploid population was identified. This marker showed polymorphism in four breeding populations segregating for true loose smut resistance. In three of these populations, genetic distance between the microsatellite and the true loose smut resistance gene varied from 8.6 to 10.3 cM. Polymorphism of the microsatellite was tested among three disease resistant lines and 21 susceptible cultivars. Fourteen to eighteen of the 21 susceptible cultivars exhibited a polymorphism for the microsatellite with respect to at least one of the disease-resistant lines. This method for the targeted development of microsatellite markers should have widespread applicability and should efficiently provide highly polymorphic markers for use in breeding programs.     

Understanding the inheritance of mungbean yellow mosaic virus (MYMV) resistance in mungbean (<Emphasis Type="Italic">Vigna radiata</Emphasis> L. Wilczek)

Mungbean, Vigna radiata, third in the series of important pulse crops, still suffers from yield loss due to mungbean yellow mosaic disease caused by mungbean yellow mosaic virus (MYMV). Hence, studies on plant-microbe interaction are necessary for understanding the inheritance of resistance. This study concentrated on identification of linked molecular markers for MYMV resistance and to find the genetic inheritance of MYMV resistance in mungbean. A total of 413 germplasm entries in a MYMV hot spot area (Vamban) were subjected to natural field infection and 13 selected resistant lines were subjected to Agrobacterium infection using strains harboring partial genome of two different MYMV isolates, VA221 and VA239. Among the resistant lines, KMG189 showed strain-specific resistance to VA221 and had no symptoms during field trials. Ninety F₂ genotypes were developed from the cross made between KMG189 (MYMV-resistant) and VBN(Gg)2 (MYMV-susceptible), segregated in the Mendelian single cross ratio 3S:1R; susceptibility of all the F₁s to MYMV suggested that the MYMV resistance in mungbean is governed by a single recessive gene. Two SCAR markers CM9 and CM815 were developed through bulk segregant analysis, and the linkage analysis proved CM815 SCAR marker to be linked at 5.56 cM with MYMV resistance gene and SCAR CM9 had nil recombination percentage, suggesting it to be very closely linked to the MYMV resistance gene. SCAR marker CM9 was present in chromosome number 3 of mungbean suggesting novel loci for virus resistance in mungbean. The identified loci can be used for developing varieties resistant to MYMV in mungbean.     

Development of novel PCR markers linked to the BYDV resistance gene <Emphasis Type="Italic">Bdv2</Emphasis> useful in wheat for marker-assisted selection

The distal segment of the long arm of the Thinopyrum intermedium chromosome 7Ai1 carries the barley yellow dwarf virus (BYDV) resistance gene Bdv2. This segment was transferred to the distal region of the long arm of wheat chromosome 7D in the Yw series of translocation lines by using the ph1b mutant to induce homoeologous pairing. To transfer Bdv2 to commercial varieties, we developed two resistance gene-analog polymorphism (RGAP) markers, Tgp-1₃₅₀ and Tgp-2₂₁₀, and one randomly amplified polymorphic DNA (RAPD) marker, OPD04₁₃₀₀. The diagnostic fragments of the RGAP marker Tgp-1₃₅₀ and the RAPD marker OPD04₁₃₀₀ were cloned, sequenced and converted into sequence-characterized amplified region (SCAR) markers, named SC-gp1 and SC-D04, respectively. SC-gp1 and SC-D04 were validated based on available translocation lines and segregating F₂ individuals. Our results indicated that the SCAR markers co-segregated with the BYDV resistance associated with Bdv2. Therefore, they can be used as a low-cost, high-throughput alternative to conventional phenotypic screening in wheat-breeding programs exploiting Bdv2. The marker-assisted selection for BYDV resistance was successfully performed in a wheat-breeding program.Electronic Supplementary Material Supplementary material is available for this article at     

Development of a PCR marker for rapid identification of the Bt-10 gene for common bunt resistance in wheat.

In western Canada, the Bt-10 resistance gene in wheat (Triticum aestivum) is effective against all the known races of common bunt caused by Tilletia tritici and T laevis. The genotypes of 199 F2 plants, originated from a cross between BW553 containing Bt-10 and the susceptible spring wheat cultivar 'Neepawa,' were established in greenhouse and field inoculation studies. A ratio of 1:2:1 resistant : heterozygous : susceptible was observed for bunt reaction, indicating that Bt-10 was expressed in a partially dominant fashion. A polymorphic DNA fragment, amplified using RAPD, and previously shown to be linked to Bt-10 was sequenced and SCAR (sequence characterized amplified region) primers devised. However, SCAR primers failed to amplify the polymorphic fragment. Restriction of PCR products with DraI revealed a polymorphic fragment of 490 bp resulting from a single base pair difference between lines possessing Bt-10 and those lacking the gene. As per the base pair difference, FSD and RSA primers were designed to generate a 275-bp polymorphic DNA fragment. Both 275- and 490-bp polymorphic fragments were present in all of the 22 cultivars known to carry Bt-10, and absent in all 16 cultivars lacking Bt-10. A 3:1 ratio was observed for presence: absence of the 275-bp marker in the F2 population. Using Southern analysis, the 490-bp fragment was effective in differentiating homozygous resistant plants from those heterozygous for Bt-10, based on its presence and the hybridization signal strength. A 1:2:1 resistant : heterozygous : susceptible ratio was also observed for the molecular marker and corresponded to 88% of the phenotypes deduced from the original F2 population. The molecular marker was estimated to be between 1.1 cM and 6.5 cM away from the Bt-10 resistance gene, based on the segregation analysis. Segregation analyses of Bt-10 and the 275-bp marker, evaluated in three different Canada Prairie Spring (CPS) wheat populations, demonstrated a segregation ratio of 3:1 for the molecular marker in two of the populations. These results demonstrated that the PCR marker system using the FSD and RSA primer pair permitted a rapid and reliable identification of individual lines carrying the Bt-10 gene for resistance to common bunt.     

Molecular Markers of Ph1 Gene in Chinese Spring and Development of Winter Wheat New Line Harboring ph1b Gene

he genomic DNA of common wheat (Triticum aestivum L.) “Chinese Spring” (CS) and its ph1b mutant were analyzed by using 19 sequence tagged site PCR (STS-PCR) primers, which derived from RFLP probes from barley (Hordeum vulgare L.) chromosome 5H. One marker was identified on wheat chromosome 5BL, which is 5.7 cM (centiMorgan) proximal to Ph1 gene, using the CS homoeologous group 5 nullisomic-tetrasomic, ditelosomic 5BL line and an F2 population from CS×ph1b mutant. This linked PCR marker was converted into a more specific sequence characterized amplified region (SCAR) marker. To obtain a new winter wheat line containing ph1b gene, the authors used a nullisomic 5B line of “Abbodanza”as a bridge parent and crossed respectively with the CS ph1b mutant (donor) and a winter wheat variety, “Jing 411” (recipient). The meiotic chromosome pairing was checked in the progeny of each cross, as well as using the marker-assistant selection of the SCAR marker identified for ph1b gene. After three inter-crossing and one selfing, a relatively stable ph1b substitution line of winter wheat with “Jing 411” background was obtained.