Association Analysis of Stem Rust Resistance in U.S. Winter Wheat

Stem rust has become a renewed threat to global wheat production after the emergence and spread of race TTKSK (also known as Ug99) and related races from Africa. To elucidate U.S. winter wheat resistance genes to stem rust, association mapping was conducted using a panel of 137 lines from cooperative U.S. winter wheat nurseries from 2008 and simple sequence repeat (SSR) and sequence tagged site (STS) markers across the wheat genome. Seedling infection types were evaluated in a greenhouse experiment using six U.S. stem rust races (QFCSC, QTHJC, RCRSC, RKQQC, TPMKC and TTTTF) and TTKSK, and adult plant responses to bulked U.S. races were evaluated in a field experiment. A linearization algorithm was used to convert the qualitative Stakman scale seedling infection types for quantitative analysis. Association mapping successfully detected six known stem rust seedling resistance genes in U.S. winter wheat lines with frequencies: Sr6 (12%), Sr24 (9%), Sr31 (15%), Sr36 (9%), Sr38 (19%), and Sr1RS^Amigo (8%). Adult plant resistance gene Sr2 was present in 4% of lines. SrTmp was postulated to be present in several hard winter wheat lines, but the frequency could not be accurately determined. Sr38 was the most prevalent Sr gene in both hard and soft winter wheat and was the most effective Sr gene in the adult plant field test. Resistance to TTKSK was associated with nine markers on chromosome 2B that were in linkage disequilibrium and all of the resistance was attributed to the Triticum timopheevii chromosome segment carrying Sr36. Potential novel rust resistance alleles were associated with markers Xwmc326-203 on 3BL, Xgwm160-195 and Xwmc313-225 on 4AL near Sr7, Xgwm495-182 on 4BL, Xwmc622-147 and Xgwm624-146 on 4DL, and Xgwm334-123 on 6AS near Sr8. Xwmc326-203 was associated with adult plant resistance to bulked U.S. races and Xgwm495-182 was associated with seedling resistance to TTKSK.     

Comparative characteristic of Triticum aestivum/Triticum durum and Triticum aestivum/Triticum dicoccum hybrid lines by genomic composition and resistance to fungal diseases under different environmental conditions

The genetic diversity of common wheat hybrid lines Triticum aestivum/Triticum durum and Triticum aestivum/Triticum dicoccum (2n = 42, F_6–7) using chromosome-specific microsatellite (SSR) markers and C-banding of chromosomes was studied. Cluster analysis of data obtained by 42 SSR markers indicated that the hybrid lines can be broken into three groups according to their origin. There were two cases of complete genetic similarity between lines 183₂-2/184₁-6 and 208-3/213-1, which were obtained using common wheat as the parental plants. In cross combinations, when the stabilization of the nuclear genome of hexaploid lines occurred against a background of the cytoplasmic genome of tetraploid wheats, there was a high level of divergence between sister lines, in some cases exceeding 50%. The evaluation of the degree of susceptibility of the lines to powdery mildew, leaf and stem rust, and septoria leaf blotch was performed under different environmental conditions. It was shown that resistance to powdery mildew and leaf rust significantly depended on the region where assays were conducted. An evaluation of the field data showed that the lines 195-3, 196-1, and 221-1 with T. durum genetic material displayed complex resistance to fungal pathogens in Western Siberia and the Republic of Belarus. For lines 195-3 and 196-1, one shows a possible contribution of chromosomes 4B and 5B in the formation of complex resistance to diseases. Hybrid lines with complex resistance can be used to expand the genetic diversity of modern common wheat cultivars for genes of immunity.     

Thinopyrum 7Ai-1-derived small chromatin with Barley Yellow Dwarf Virus (BYDV) resistance gene integrated into the wheat genome with retrotransposon

Thinopyrum intermedium is a useful source of resistance genes for Barley Yellow Dwarf Virus (BYDV), one of the most damaging wheat diseases. In this study, wheat/Th. intermedium translocation lines with a BYDV resistance gene were developed using the Th. intermedium 7Ai-1 chromosome. Genomic in situ hybridization (GISH), using a Th. intermedium total genomic DNA probe, enabled detection of 7Ai-1-derived small chro-matins containing a BYDV resistance gene, which were translocated onto the end of wheat chromosomes in the lines Y95011 and Y960843. Random amplified polymorphic DNA (RAPD) analyses using 120 random 10-mer primers were conducted to compare the BYDV-resistant translocation lines with susceptible lines. Two primers amplified the DNA fragments specific to the resistant line that would be useful as molecular markers to identify 7Ai-1-derived BYDV resistance chromatin in the wheat genome. Additionally, the isolated Th. intermedium-specific retrotransposon-like sequence pTi28 can be used to identify Th. intermedium chromatin transferred to the wheat genome.     

Potential new sources of wheat curl mite resistance in wheat to prevent the spread of yield-reducing pathogens

The wheat curl mite (WCM), Aceria tosichella Keifer (Trombidiformes: Eriophyidae), is a major pest in cropping regions of the world and is recognised as the primary vector of several yield-reducing pathogens, primarily affecting wheat. Management of WCM is complicated due to several aspects of the mite’s biology and ecology; however, commercially viable mite resistant wheat varieties may offer practical long-term management options. Unfortunately, mite populations have adapted to previously identified sources of resistance, highlighting the need for further sources of resistance and the value of stacking different resistances to give greater degrees and longevity of control. In this study we assessed the susceptibility of 42 wheat-derived genotypes to mite population growth using a new experimental method that overcomes methodological limitations of previous studies. Experimental wheat lines included a variety of wheat genotypes, related Triticeae species, wheat-alien chromosome amphiploids, and chromosome addition or substitution lines. From these we identify new promising sources of WCM resistance associated with Thinopyrum intermedium, Th. ponticum and Hordeum marinum chromosomes. More specifically we identify group 1J and 5J chromosomes of the L3 and L5 wheat-Th. intermedium addition lines as new sources of resistance that could be exploited to transfer resistance onto homoeologous wheat chromosomes. This study offers new methods for reliable in situ estimations of mite abundance on cereal plants, and new sources of WCM resistance that may assist management of WCM and associated viruses in wheat.     

Identification of Kernel Proteins Associated with the Resistance to Fusarium Head Blight in Winter Wheat (Triticum aestivum L.)

Numerous potential components involved in the resistance to Fusarium head blight (FHB) in cereals have been indicated, however, our knowledge regarding this process is still limited and further work is required. Two winter wheat (Triticum aestivum L.) lines differing in their levels of resistance to FHB were analyzed to identify the most crucial proteins associated with resistance in this species. The presented work involved analysis of protein abundance in the kernel bulks of more resistant and more susceptible wheat lines using two-dimensional gel electrophoresis and mass spectrometry identification of proteins, which were differentially accumulated between the analyzed lines, after inoculation with F. culmorum under field conditions. All the obtained two-dimensional patterns were demonstrated to be well-resolved protein maps of kernel proteomes. Although, 11 proteins were shown to have significantly different abundance between these two groups of plants, only two are likely to be crucial and have a potential role in resistance to FHB. Monomeric alpha-amylase and dimeric alpha-amylase inhibitors, both highly accumulated in the more resistant line, after inoculation and in the control conditions. Fusarium pathogens can use hydrolytic enzymes, including amylases to colonize kernels and acquire nitrogen and carbon from the endosperm and we suggest that the inhibition of pathogen amylase activity could be one of the most crucial mechanisms to prevent infection progress in the analyzed wheat line with a higher resistance. Alpha-amylase activity assays confirmed this suggestion as it revealed the highest level of enzyme activity, after F. culmorum infection, in the line more susceptible to FHB.     

Genome-wide association mapping for seedling and field resistance to <Emphasis Type="Italic">Puccinia striiformis</Emphasis> f. sp. <Emphasis Type="Italic">tritici</Emphasis> in elite durum wheat

Key message

Genome-wide association analysis in tetraploid wheat revealed novel and diverse loci for seedling and field resistance to stripe rust in elite spring durum wheat accessions from worldwide.

Abstract

Improving resistance to stripe rust, caused by Puccinia striiformis f. sp. tritici, is a major objective for wheat breeding. To identify effective stripe rust resistance loci, a genome-wide association study (GWAS) was conducted using 232 elite durum wheat (Triticum turgidum ssp. durum) lines from worldwide breeding programs. Genotyping with the 90 K iSelect wheat single nucleotide polymorphism (SNP) array resulted in 11,635 markers distributed across the genome. Response to stripe rust infection at the seedling stage revealed resistant and susceptible accessions present in rather balanced frequencies for the six tested races, with a higher frequency of susceptible responses to United States races as compared to Italian races (61.1 vs. 43.1% of susceptible accessions). Resistance at the seedling stage only partially explained adult plant resistance, which was found to be more frequent with 67.7% of accessions resistant across six nurseries in the United States. GWAS identified 82 loci associated with seedling stripe rust resistance, five of which were significant at the false discovery rate adjusted P value <0.1 and 11 loci were detected for the field response at the adult plant stages in at least two environments. Notably, Yrdurum-1BS.1 showed the largest effect for both seedling and field resistance, and is therefore considered as a major locus for resistance in tetraploid wheat. Our GWAS study is the first of its kind for stripe rust resistance in tetraploid wheat and provides an overview of resistance in elite germplasm and reports new loci that can be used in breeding resistant cultivars.

     

Resistance of tomatoes to late blight (Phytophthora infestans)

Race T₁ of Phytophthora infestans was first isolated in Central Europe. Tomato varieties carrying the dominant gene Ph were easily infected by T₁ but showed a different degree of field resistance. In September 1967 more than 80% of all isolations from the experimental plots at Greifswald were determined as the aggressive race T₁. This race was also isolated in a large screening test over several provinces of the GDR from potato and tomato fields where no plants carrying dominant resistance genes were present in the neighbourhood. The fungus was able to pass from potato leaves or tubers to detached tomato leaves or intact tomato plants (cv. Fanal) without any reduction in sporulation. The field-resistant tomato variety Ru?ový Ker and the highly field-resistant variety Atom were crossed. In F₂ and subsequent generations, young plants were selected following inoculation of 14 mm leaf-discs. Weak sporulations on the leaf-discs were almost invariably correlated with a reduced level of infection of fruit in the field. Data from crosses of Atom with more or less susceptible varieties suggested the presence of incompletely dominant genes. It is concluded that at least two genes in the variety Atom control field resistance and the gene-symbols Phf and Phf-2 are proposed for them.     

Pyramiding of transgenic <Emphasis Type="Italic">Pm3</Emphasis> alleles in wheat results in improved powdery mildew resistance in the field

Key message

The combined effects of enhanced total transgene expression level and allele-specificity combination in transgenic allele-pyramided Pm3 wheat lines result in improved powdery mildew field resistance without negative pleiotropic effects.

Abstract

Allelic Pm3 resistance genes of wheat confer race-specific resistance to powdery mildew (Blumeria graminis f. sp. tritici, Bgt) and encode nucleotide-binding domain, leucine-rich repeat (NLR) receptors. Transgenic wheat lines overexpressing alleles Pm3a, b, c, d, f, and g have previously been generated by transformation of cultivar Bobwhite and tested in field trials, revealing varying degrees of powdery mildew resistance conferred by the transgenes. Here, we tested four transgenic lines each carrying two pyramided Pm3 alleles, which were generated by crossbreeding of lines transformed with single Pm3 alleles. All four allele-pyramided lines showed strongly improved powdery mildew resistance in the field compared to their parental lines. The improved resistance results from the two effects of enhanced total transgene expression levels and allele-specificity combinations. In contrast to leaf segment tests on greenhouse-grown seedlings, no allelic suppression was observed in the field. Plant development and yield scores of the pyramided lines were similar to the mean scores of the corresponding parental lines, and thus, the allele pyramiding did not cause any negative effects. On the contrary, in pyramided line, Pm3b × Pm3f normal plant development was restored compared to the delayed development and reduced seed set of parental line Pm3f. Allele-specific RT qPCR revealed additive transgene expression levels of the two Pm3 alleles in the pyramided lines. A positive correlation between total transgene expression level and powdery mildew field resistance was observed. In summary, allele pyramiding of Pm3 transgenes proved to be successful in enhancing powdery mildew field resistance.

     

Sources and donors of resistance to wheat spot blotch caused by Bipolaris sorokiniana Shoem. (Cochliobolus sativus Drechs. ex Dastur)

The resistance of wheat lines and cultivars from the Institute of Crop Breeding (Harbin, China) and synthetic, hexaploid wheat lines derived from T. durum and T. tauschii (CIMMYT) were screened for resistance to spot blotch Bipolaris sorokiniana Shoem. using field and laboratory tests. The highly and moderately resistant wheat samples were determined. The satisfactory coincidence of data obtained from evaluation of type reaction of seedlings and disease severity in adult plant stage was demonstrated. The genetics of resistance in Chinese lines Long 98-4554, Long 98-4546, Long mai 24, Long mai 23 and Canadian line 181-5 was studied using hybridological analysis. The resistance in these lines was inherited as quantitative traits and was conditioned by a few (one or two) genes. The absence of susceptible plants in F₂ in crosses of resistant lines Long 98-4554, Long 98-4546, Long mai 24 and 181-5 can testify to the presence of a common gene of resistance. Our data reveals the poor genetic diversity for spot blotch resistance in studying wheat genotypes.     

Enhanced resistance to stripe rust disease in transgenic wheat expressing the rice chitinase gene RC24

Stripe rust is a devastating fungal disease of wheat worldwide which is primarily caused by Puccinia striiformis f. sp tritici. Transgenic wheat (Triticum aestivum L.) expressing rice class chitinase gene RC24 were developed by particle bombardment of immature embryos and tested for resistance to Puccinia striiformis f.sp tritici. under greenhouse and field conditions. Putative transformants were selected on kanamycin-containing media. Polymease chain reaction indicated that RC24 was transferred into 17 transformants obtained from bombardment of 1,684 immature embryos. Integration of RC24 was confirmed by Southern blot with a RC24-labeled probe and expression of RC24 was verified by RT-PCR. Nine transgenic T₁ lines exhibited enhanced resistance to stripe rust infection with lines XN8 and BF4 showing the highest level of resistance. Southern blot hybridization confirmed the stable inheritance of RC24 in transgenic T₁ plants. Resistance to stripe rust in transgenic T₂ and T₃ XN8 and BF4 plants was confirmed over two consecutive years in the field. Increased yield (27–36 %) was recorded for transgenic T₂ and T₃ XN8 and BF4 plants compared to controls. These results suggest that rice class I chitinase RC24 can be used to engineer stripe rust resistance in wheat.     

QTL mapping of resistance to race Ug99 of Puccinia graminis f. sp. tritici in durum wheat (Triticum durum Desf.)

Stem rust caused by Puccinia graminis f. sp. tritici was historically one of the most destructive diseases of wheat worldwide. The evolution and rapid migration of race TTKSK (Ug99) and derivatives, first detected in Uganda in 1999, are of international concern due to the virulence of these races to widely used stem rust resistance genes. In attempts to identify quantitative trait loci (QTL) linked with resistance to stem rust race Ug99, 95 recombinant inbred lines that were developed from a cross between two durum wheat varieties, Kristal and Sebatel, were evaluated for reaction to stem rust. Seven field trials at two locations were carried out in main and off seasons. In addition to the natural infection, the nursery was also artificially inoculated with urediniospores of stem rust race Ug99 and a mixture of locally collected stem rust urediniospores. A genetic map was constructed based on 207 simple sequence repeat (SSR) and two sequence tagged site loci. Using composite interval mapping, nine QTL for resistance to stem rust were identified on chromosomes 1AL, 2AS, 3BS, 4BL, 5BL, 6AL 7A, 7AL and 7BL. These results suggest that durum wheat resistance to stem rust is oligogenic and that there is potential to identify previously uncharacterized resistance genes with minor effects. The SSR markers that are closely linked to the QTL can be used for marker-assisted selection for stem rust resistance in durum wheat.     

Mapping of the loose smut resistance gene Ut6 in wheat (Triticum aestivum L.)

Loose smut of wheat (Triticum aestivum L.) caused by Ustilago tritici (Pers.) Rostr. can cause considerable yield losses in the absence of appropriate management practices. The use of wheat varieties with loose smut resistance is an efficient and effective control technique. However, the development of commercial wheat lines with resistance to loose smut is time- and labour-consuming. DNA markers linked to loose smut resistance gene(s) would assist the development of loose smut resistant genotypes. The genetics of loose smut resistance was studied in an F5‐derived recombinant inbred line (RIL) population of 94 lines from the cross BW278/AC Foremost. The line AC Foremost is resistant and line BW278 is susceptible to U. tritici race T10. Phenotypic assessment revealed that a single gene, designated Ut6, segregated for resistance to race T10 in the RIL population. A modified bulked segregant analysis identified a microsatellite marker linked to Ut6. A linkage map was developed consisting of linked microsatellite loci and the resistance gene. The loose smut resistance gene Ut6 mapped to the long arm of chromosome 5B. Five microsatellite markers mapped within 6.7 cM of Ut6. The microsatellite markers gpw5029 and barc232 flanked Ut6 at distances of 1.3 and 2.8 cM on the distal and proximal sides, respectively. A diverse set of wheat lines was haplotyped for Ut6 using the linked microsatellite markers gpw5029 and barc232. The haplotype analysis suggested that the microsatellite markers associated with Ut6 will be useful for marker-assisted selection of loose smut resistant wheat lines.     

Partial Resistance to Heterodera avenae in Wheat Lines with the 6M v Chromosome from Aegilops ventricosa

Lines of wheat with the 6M^v chromosome from Aegilops ventricosa display partial resistance to both pathotypes Hal2 and Ha41 of Heterodera avenae. With either pathotype, the effect of this alien chromosome on cyst production, size, and fecundity was expressed in resistance tests. Partial resistance of five 6M^v(6D) substitution lines varied according to the intrinsic cyst-forming capacity of the nematode pathotypes and the recipient germplasms. Such partial resistance can be utilized in wheat breeding lines for integrated management of the cereal cyst nematode.     

Coexpression of the High Molecular Weight Glutenin Subunit 1Ax1 and Puroindoline Improves Dough Mixing Properties in Durum Wheat (Triticum turgidum L. ssp. durum)

Wheat end-use quality mainly derives from two interrelated characteristics: the compositions of gluten proteins and grain hardness. The composition of gluten proteins determines dough rheological properties and thus confers the unique viscoelastic property on dough. One group of gluten proteins, high molecular weight glutenin subunits (HMW-GS), plays an important role in dough functional properties. On the other hand, grain hardness, which influences the milling process of flour, is controlled by Puroindoline a (Pina) and Puroindoline b (Pinb) genes. However, little is known about the combined effects of HMW-GS and PINs on dough functional properties. In this study, we crossed a Pina-expressing transgenic line with a 1Ax1-expressing line of durum wheat and screened out lines coexpressing 1Ax1 and Pina or lines expressing either 1Ax1 or Pina. Dough mixing analysis of these lines demonstrated that expression of 1Ax1 improved both dough strength and over-mixing tolerance, while expression of PINA detrimentally affected the dough resistance to extension. In lines coexpressing 1Ax1 and Pina, faster hydration of flour during mixing was observed possibly due to the lower water absorption and damaged starch caused by PINA expression. In addition, expression of 1Ax1 appeared to compensate the detrimental effect of PINA on dough resistance to extension. Consequently, coexpression of 1Ax1 and PINA in durum wheat had combined effects on dough mixing behaviors with a better dough strength and resistance to extension than those from lines expressing either 1Ax1 or Pina. The results in our study suggest that simultaneous modulation of dough strength and grain hardness in durum wheat could significantly improve its breadmaking quality and may not even impair its pastamaking potential. Therefore, coexpression of 1Ax1 and PINA in durum wheat has useful implications for breeding durum wheat with dual functionality (for pasta and bread) and may improve the economic values of durum wheat.     

Introgression of stem rust resistance genes SrTA10187 and SrTA10171 from Aegilops tauschii to wheat

Aegilops tauschii, the diploid progenitor of the wheat D genome, is a readily accessible germplasm pool for wheat breeding as genes can be transferred to elite wheat cultivars through direct hybridization followed by backcrossing. Gene transfer and genetic mapping can be integrated by developing mapping populations during backcrossing. Using direct crossing, two genes for resistance to the African stem rust fungus race TTKSK (Ug99), were transferred from the Ae. tauschii accessions TA10187 and TA10171 to an elite hard winter wheat line, KS05HW14. BC₂ mapping populations were created concurrently with developing advanced backcross lines carrying rust resistance. Bulked segregant analysis on the BC₂ populations identified marker loci on 6DS and 7DS linked to stem rust resistance genes transferred from TA10187 and TA10171, respectively. Linkage maps were developed for both genes and closely linked markers reported in this study will be useful for selection and pyramiding with other Ug99-effective stem rust resistance genes. The Ae. tauschii-derived resistance genes were temporarily designated SrTA10187 and SrTA10171 and will serve as valuable resources for stem rust resistance breeding.     

Mapping of QTL conferring resistance to sharp eyespot (Rhizoctonia cerealis) in bread wheat at the adult plant growth stage

Key message

Seven sharp eyespot resistance QTL were detected consistently across five environments and delimited to seven DNA marker intervals, respectively, six of which were independent of plant height and heading time.

Abstract

Sharp eyespot, caused mainly by the soil-borne fungus Rhizoctonia cerealis, is one of the important diseases of bread wheat (Triticum aestivum L.). This disease has escalated into a major threat to wheat production in some regions of the world. Wheat resistance to sharp eyespot can be a potential means to reduce the needs for application of fungicides and agricultural inputs. In the present study, the winter wheat lines, Luke and AQ24788-83, both of which possess quantitative resistance to sharp eyespot, were crossed and a population consisting 241 recombinant-inbred lines (RILs) was constructed. These RILs were assessed for sharp eyespot resistance by conducting five field and greenhouse trials during the period from 2008 to 2012, and they were genotyped with 549 simple-sequence repeat DNA markers. Seven quantitative trait loci (QTL) were detected consistently across the five trial environments to be associated with the sharp eyespot resistance. They were mapped on chromosomes 1A, 2B, 3B, 4A, 5D, 6B, and 7B. Four of these QTL are unequivocally novel, while it is possible that the other three might also be novel. Plant height and heading date of the 241 RILs were recorded in the four field trials. All of the seven disease resistance QTL were independent of plant height and heading time except one that was significantly associated with plant heading time. This association might be attributed genetically to a single QTL, or to different but closely linked QTL. In the case of single QTL, pleiotropism might be involved or the sharp eyespot resistance might be conferred in a physical instead of physiological nature.     

Haplotype diversity of stem rust resistance loci in uncharacterized wheat lines

Stem rust is one of the most destructive diseases of wheat worldwide. The recent emergence of wheat stem rust race Ug99 (TTKS based on the North American stem rust race nomenclature system) and related strains threaten global wheat production because they overcome widely used genes that had been effective for many years. Host resistance is likely to be more durable when several stem rust resistance genes are pyramided in a single wheat variety; however, little is known about the resistance genotypes of widely used wheat germplasm. In this study, a diverse collection of wheat germplasm was haplotyped for stem rust resistance genes Sr2, Sr22, Sr24, Sr25, Sr26, Sr36, Sr40, and 1A.1R using linked microsatellite or simple sequence repeat (SSR) and sequence tagged site (STS) markers. Haplotype analysis indicated that 83 out of 115 current wheat breeding lines from the International Maize and Wheat Improvement Center (CIMMYT) likely carry Sr2. Among those, five out of 94 CIMMYT spring lines tested had both Sr2 and Sr25 haplotypes. Five out of 22 Agriculture Research Service (ARS) lines likely have Sr2 and a few have Sr24, Sr36, and 1A.1R. Two out of 43 Chinese accessions have Sr2. No line was found to have the Sr26 and Sr40 haplotypes in this panel of accessions. DArT genotyping was used to identify new markers associated with the major stem resistance genes. Four DArT markers were significantly associated with Sr2 and one with Sr25. Principal component analysis grouped wheat lines from similar origins. Almost all CIMMYT spring wheats were clustered together as a large group and separated from the winter wheats. The results provide useful information for stem rust resistance breeding and pyramiding.     

Expression of apoplast-targeted plant defensin <Emphasis Type="Italic">MtDef4.2</Emphasis> confers resistance to leaf rust pathogen <Emphasis Type="Italic">Puccinia triticina</Emphasis> but does not affect mycorrhizal symbiosis in transgenic wheat

Rust fungi of the order Pucciniales are destructive pathogens of wheat worldwide. Leaf rust caused by the obligate, biotrophic basidiomycete fungus Puccinia triticina (Pt) is an economically important disease capable of causing up to 50 % yield losses. Historically, resistant wheat cultivars have been used to control leaf rust, but genetic resistance is ephemeral and breaks down with the emergence of new virulent Pt races. There is a need to develop alternative measures for control of leaf rust in wheat. Development of transgenic wheat expressing an antifungal defensin offers a promising approach to complement the endogenous resistance genes within the wheat germplasm for durable resistance to Pt. To that end, two different wheat genotypes, Bobwhite and Xin Chun 9 were transformed with a chimeric gene encoding an apoplast-targeted antifungal plant defensin MtDEF4.2 from Medicago truncatula. Transgenic lines from four independent events were further characterized. Homozygous transgenic wheat lines expressing MtDEF4.2 displayed resistance to Pt race MCPSS relative to the non-transgenic controls in growth chamber bioassays. Histopathological analysis suggested the presence of both pre- and posthaustorial resistance to leaf rust in these transgenic lines. MtDEF4.2 did not, however, affect the root colonization of a beneficial arbuscular mycorrhizal fungus Rhizophagus irregularis. This study demonstrates that the expression of apoplast-targeted plant defensin MtDEF4.2 can provide substantial resistance to an economically important leaf rust disease in transgenic wheat without negatively impacting its symbiotic relationship with the beneficial mycorrhizal fungus.     

Quantitative trait loci for resistance to fusarium head blight in a Chinese wheat landrace Haiyanzhong

Fusarium head blight (FHB) of wheat causes not only significant reduction in grain yield and end-use quality, but also the contamination of the grain with mycotoxins that are detrimental to human and animal health after consumption of infected grain. Growing resistant varieties is an effective approach to minimize the FHB damage. The Chinese wheat landrace Haiyanzhong (HYZ) shows a high level of resistance to FHB. To identify quantitative trait loci (QTL) that contribute to FHB resistance in HYZ, 136 recombinant inbred lines (RIL) were developed from a cross of HYZ and Wheaton, a hard spring wheat cultivar from the USA. The RIL and their parents were evaluated for percentage of scabbed spikelets (PSS) in both greenhouse and field environments. Five QTL were detected for FHB resistance in HYZ with one major QTL on 7DL. The 7DL QTL peaked at SSR marker Xwmc121, which is flanked by the SSR markers Xcfd46 and Xwmc702. This QTL explained 20.4?C22.6% of the phenotypic variance in individual greenhouse experiments and 15.9% in a field experiment. Four other minor QTL on 6BS (two QTL), 5AS and 1AS each explained less than 10% of the phenotypic variance in individual experiments. HYZ carried the favorable alleles associated with FHB resistance at the QTL on 7DL, 6BS and 5AS, and the unfavorable allele at the QTL on 1AS. The major QTL on 7D can be used to improve the FHB resistance in wheat breeding programs and add diversity to the FHB resistance gene pool.